41812 SY/40412 SY 20120305-S00003 No.A2026-1/4

http://onsemi.com

Semiconductor Components Industries, LLC, 2013

May, 2013

LB1638MC

Overview

The LB1638MC are low-saturation bidirectional motor driver ICs for use in low-voltage applications. At an IO of

500mA, they have a low saturation output of VO(sat) = 0.75V. They are especially suited for use in compact motor of

portable equipment.

Features

• Low voltage operation (2.5V min.)

• Low saturation voltage (upper transistor + lower transistor residual voltage; at IO = 500mA, VO(sat) = 0.75V typ.)

• Low current drain at standby mode (ICCO = 0.1μA typ. or less)

• Separate logic power supply and motor power supply

• Brake function

• Built-in spark killer diodes

Specifications

Absolute Maximum Ratings at Ta = 25

°C

Parameter

Symbol

Conditions

Ratings

Unit

VCC max

-0.3 to +10.5

V

Maximum supply voltage

VS max

-0.3 to +10.5

V

Output applied voltage

VOUT

-0.3 to VCC+ VSF

V

Input applied voltage

VIN

-0.3 to +10.0

V

Ground pin flow-out current

IGND

1.0

A

Allowable power dissipation

Pd max

Mounted on a specified board

820

mW

Operating temperature

Topr

-20 to +75

°C

Storage temperature

Tstg

-40 to +125

°C

* Specified board: 114.3mm

× 76.1mm × 1.6mm, glass epoxy board.

Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.

Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,

high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.

Monolithic Digital IC

Low-Voltage, Low-Saturation

Bidirectional Motor Driver

Ordering number : ENA2026A

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating

Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.