PPC5604EEMLH datasheet(21/75 Pages) FREESCALE

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Electrical characteristics

MPC5604E Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor

Electrical characteristics

3.1

Introduction

This section contains electrical characteristics of the device as well as temperature and power considerations.

This product contains devices to protect the inputs against damage due to high static voltages. However, it is advisable to take

precautions to avoid application of any voltage higher than the specified maximum rated voltages.

To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS). This can be done by the

internal pull-up or pull-down, which is provided by the product for most general purpose pins.

The parameters listed in the following tables represent the characteristics of the device and its demands on the system.

In the tables where the device logic provides signals with their respective timing characteristics, the symbol “CC” for Controller

Characteristics is included in the Symbol column.

In the tables where the external system must provide signals with their respective timing characteristics to the device, the symbol

“SR” for System Requirement is included in the Symbol column.

CAUTION

All of the following figures are indicative and must be confirmed during either silicon validation, silicon characterization or

silicon reliability trial.

3.2

Parameter classification

The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better

understanding, the classifications listed in Table 5 are used and the parameters are tagged accordingly in the tables where

appropriate.

NOTE

The classification is shown in the column labeled “C” in the parameter tables where

appropriate.

Table 5. Parameter classifications

Classification tag

Tag description

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically

relevant sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from typical

devices under typical conditions unless otherwise noted. All values shown in the typical column

are within this category.

Those parameters are derived mainly from simulations.

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