| 数据搜索系统,热门电子元器件搜索 |
|
1410187-3 数据表(PDF) 2 Page - Tyco Electronics |
|
|
|||||||||||||||||||||||||||||
1410187-3 数据表(HTML) 2 Page - Tyco Electronics |
|
2 / 6 page ![]() www.te.com/products/2Piece-High-Speed High Speed Backplane Connectors TE Connectivity Signal Integrity at TE TE Connectivity gets the best performance out of connectors by applying system-level signal integrity design expertise to each high-speed product. Our modeling and simulation skills are second to none with global expertise in the U.S., Europe, and Asia. Our global presence places simulation, modeling, and system layout experts next to the customer. Modeling and Simulation At TE the design process starts with signal integrity. Signal integrity engineers use sophisticated 3D tools to provide accurate connector and footprint via pattern performance prior to production. TE has the tools and expertise to get the right answer. n Ansys HFSS and CST Microwave Studio Full-wave 3D tools n Both connector and footprint via pattern(s) analyzed before production n S-parameter and SPICE analysis n Sophisticated ADS and MATLAB system analysis Customer Support and Tools From test boards to simulation models, TE provides a library of tools that help you successfully implement your system. Requests can be easily made through our signal integrity website: www.te.com/documentation/electrical-models n Ansys HFSS and CST Microwave Studio Full-wave 3D tools n Both connector and footprint via pattern(s) analyzed before production n S-parameter and SPICE analysis n Sophisticated ADS and MATLAB system analysis n Measurement based S-parameter connector models (64+ ports) n Modeling based S-parameter connector models (64+ ports) n Footprint via pattern S-parameter and SPICE models n SPICE connector models n Connector evaluation test boards n System test boards Test Capability With measurement capabilities beyond 12.5 Gbps and 50 GHz, TE can characterize and provide detailed measurements for its products. Cutting-edge measurement calibration techniques and board design enable accurate de-embedding of test fixtures. TE has also teamed with numerous silicon com- panies to provide active device measurements that can be invaluable to assure the successful implementation of a design. n Advanced calibration techniques de-embed fixture n Frequency domain to 50 GHz n Time domain eye pattern/BERT to 12.5 Gbps n Active silicon testing – multiple vendors 2 – 10+ Gbps n Both system and “connector only” boards |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |