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OP227GN 数据表(PDF) 7 Page - List of Unclassifed Manufacturers

部件名 OP227GN
功能描述  MICROCIRCUIT, LINEAR, LOW NOISE OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
PDF  9 Pages
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制造商  ETC2 [List of Unclassifed Manufacturers]
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标志 ETC2 - List of Unclassifed Manufacturers

OP227GN 数据表(HTML) 7 Page - List of Unclassifed Manufacturers

  OP227GN Datasheet HTML 1Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 2Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 3Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 4Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 5Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 6Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 7Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 8Page - List of Unclassifed Manufacturers OP227GN Datasheet HTML 9Page - List of Unclassifed Manufacturers  
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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86887
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
7
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004)
1
Final electrical test parameters
(method 5004)
1*, 2,3,4
Group A test requirements
(method 5005)
1,2,3,4,5,6,7
Groups C and D end-point
electrical parameters
(method 5005)
1,2,3
* PDA applies to subgroup 1.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.



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