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ADL5310ACP-R2 数据表(PDF) 16 Page - Analog Devices |
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ADL5310ACP-R2 数据表(HTML) 16 Page - Analog Devices |
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16 / 20 page ![]() ADL5310 Rev. A | Page 16 of 20 CHARACTERIZATION METHODS The solution in Figure 37 is no longer subject to potential channel mismatch issues. Individual channel slope and intercept characteristics can be calibrated independently. The accuracy was verified using a pair of calibrated current sources. The performance of the circuit depicted in Figure 37 is shown in Figure 38 and Figure 39. Multiple transfer functions and error plots are provided for various power levels. The accuracy is better than 0.1 dB over a 5-decade range. The dynamic range is slightly reduced for strong IIN input currents. This is due to the limited available swing of the VLOG pin and can be recovered through careful selection of input and output optical tap coupling ratios. During the characterization of the ADL5310, the device was treated as a precision current-input logarithmic converter, because it is impractical to generate accurate photocurrents by illuminating a photodiode. The test currents were generated by using either a well-calibrated current source, such as the Keithley 236, or a high value resistor from a voltage source to the input pin. Great care is needed when using very small input currents. For example, the triax output connection from the current generator was used with the guard tied to VSUM. The input trace on the PC board was guarded by connecting adjacent traces to VSUM. 1.0 1.2 1.4 1.6 1.8 0.8 0.6 0.4 0.2 0 –10 0 10 20 30 40 50 –20 LOG10 [IPD1/IPD2] (dB) 60 α 21 FOR MULTIPLE VALUES OF IPD1 φ 2 WHEN IPD1 = 100µA These measures are needed to minimize the risk of leakage current paths. With 0.5 V as the nominal bias on the INP1 (INP2) pin, a leakage-path resistance of 1 GΩ to ground would subtract 0.5 nA from the input, which amounts to a −1.6 dB error for a 3 nA source current. Additionally, the very high sensitivity at the input pins and the long cables commonly needed during characterization allow 60 Hz and RF emissions to introduce substantial measurement errors. Careful guarding techniques are essential to reducing the pickup of these spurious signals. Additional information, including test setups, can be found in the AD8305 and ADL5306 data sheets. Figure 38. Absorbance and Absolute Power Transfer Functions for Wilson Mirror ADL5310 Combination 0 0.1 0.2 0.3 0.4 0.5 –0.1 –0.2 –0.3 –0.4 –0.5 –30 –20 –10 0 10 20 30 –40 LOG10 [IPD1/IPD2] (dB) 40 50 60 IPD1 =10µA IPD1 = 100µA IPD1 =1µA Figure 39. Log Conformance for Wilson Mirror ADL5310 Combination, Normalized to 10 mA Channel 1 Input Current, IIN1 |
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