Low Resistance Chip Resistor

DOCUMENT

NO.

SRK320000NH

PAGE

REV.

A1

UNLESS OTHERWISE SPECIFIED

TOLERANCES ON ﹕

X

= ±

X.X

= ±

X.XX

= ±

ANGLES ±

HOLE DIA. ±

SCALE ﹕

X

UNIT ﹕ X

APPROVED

BY ﹕

DRAWN

BY ﹕connie 4/3/13

DESIGNED

BY ﹕

CHECKED

BY ﹕

THIS DRAWINGS AND SPECIFICATIONS ARE THE PROPERTY OF Delta Electronics, Inc.

AND SHALL NOT BE REPRODUCED OR USED AS THE BASIS FOR THE

MANUFACTURE OR SALE OF APPARATUS OR DEVICES WITHOUT PERMISSION

台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

Delta Electronics, Inc.

PAGE

5

OF

9

6-3 Endurance

Item

Specification and Requirement

Test Method (JIS 5201)

Rapid Change of

Temperature

△ R:±1.0%

Without distinct damage in

appearance

(1) Repeat 5 cycle as follow:

(-55 ± 3℃,30minutes)

→(Room temperature, 2~3

minutes)

→(+125 ± 2℃,30minutes)

→(Room temperature 2~3

minutes)

(2) Measuring resistance

1 hour after test

Moisture with Load

△ R: ±5.0%

Without distinct damage in

appearance

(1) Environment condition:

40 ± 2℃,90~95% RH

(2) Applied Voltage: rated voltage

(3) Test period: (1.5 hour ON)

→(0.5 hour OFF) cycled for

total

1,000 + 48 / - 0 hours

(4) Measuring resistance

1 hour after test

Load Life

△ R: ±5.0%

Without distinct

damage in appearance

(1) Test temperature: 70 ± 3℃

(2) Applied Voltage: rated voltage

(3) Test period: (1.5 hour ON)

→(0.5 hour OFF) cycled for

total

1,000 + 48 / - 0 hours

(4) Measuring resistance

1 hour after test

Low Temperature Store

△ R: ± 5.0%

Without distinct

damage in appearance

(1) Store temperature:

-55 ± 3℃ for total

1,000 + 48 / - 0 hours

(2) Measuring resistance

1 hour after test

High Temperature Store

△ R: ± 5.0%

Without distinct

damage in appearance

(1) Store temperature:

+125 ± 2℃ for total

1,000 + 48 / - 0 hours

(2) Measuring resistance

1 hour after test