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台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

台達電子工業股份有限公司

Delta Electronics, Inc.

The Engineering Spec. For 3/4W 2010

Low Resistance Chip Resistor

6. Characteristics

Test Item

Condition of Test

Requirements

Short Time Overload

2.5 * rated voltage for 5 seconds

Refer to JIS C 5201-1 4.13

∆R : ± (0.5%+0.0005

Without significant damage by

flashover ( spark, arching ), burning

or breakdown etc.

Insulation Resistance

The resistor shall be cramped in the

metal block and tested , as shown below.

Test voltage : 100

± 15V

Refer to JIS C 5201-1 4.6 Mounting

condition G.

Between Electrode and Protection

Film 100M

Ω or over

Between Electrode and Substrate

1,000M

Ω or over

Voltage Proof

Refer to JIS C 5201-1 4.7

∆R : ± (0.5%+0.0005

Without damage by flashover, fire

or breakdown, as shown below.

Thermal Shock

-55 ~125℃ 5 cycles, 15 min at each

extreme condition

Refer to JIS C 5201-1 4.19

∆R : ± (1.0%+0.0005

Without distinct damage in

appearance

Low Temperature Storage

Kept at -55℃, 1,000 hours

Refer to JIS C 5201-1 4.23.4

∆R : ± (1.0%+0.0005

Without distinct damage in

appearance

High Temperature Exposure

Kept at 125℃ for 1,000 hours

Refer to JIS C 5201-1 4.23.2

∆R : ± (1.0%+0.0005

Without distinct damage in

appearance

Solderability

Temperature of Solder : 245

± 5℃

Immersion Duration : 3

± 0.5 second

Refer to JIS C 5201-1 4.17

Uniform coating of solder cover

minimum of 95% surface being

immersed

Resistance to Soldering Heat

Dipped into solder at 270

± 5℃

for 10

± 1 seconds

Refer to JIS C 5201-1 4.18

∆R : ± (0.5%+0.0005

Without distinct deformation in

appearance