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ADL5310ACP-R2 数据表(PDF) 15 Page - Analog Devices |
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ADL5310ACP-R2 数据表(HTML) 15 Page - Analog Devices |
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15 / 20 page ![]() ADL5310 Rev. A | Page 15 of 20 A 10 nF capacitor on each VSUM pin (20 nF parallel equivalent) combined with the 16 kΩ source resistance yields a 500 Hz pole, which is sufficiently below the bandwidth for the minimum input current of 3 nA. Residual crosstalk disturbance is particularly problematic at the lowest currents for two reasons. First, the loop is unable to reject summing node disturbances beyond the limited bandwidth. Second, the settling response at the lowest currents to any residual disturbance is significantly slower than that for input currents even one or two decades higher (see Figure 18). –6 –3 0 3 6 9 12 0 0.2 0.4 0.6 0.8 1.0 1.2 0 0.5 1.0 1.5 2.0 2.5 TIME (ms) ACTIVE CHANNEL OUTPUT PULSE, 1-DECADE STEP 3 µA TO 30µA INACTIVE CHANNEL RESPONSE IINP – 100nA IINP – 10nA IINP – 30nA IINP – 3nA Figure 36. Crosstalk Pulse Response for Various Input Current Values Figure 36 shows the measured response of an inactive channel (dc input) to a 1-decade current step on the input of the active channel for several inactive channel dc current values. Addi- tional system considerations may be necessary to ensure adequate settling time following a known transient when one or both channels are operating at very low input currents. RELATIVE AND ABSOLUTE POWER MEASUREMENTS When properly calibrated, the ADL5310 provides two inde- pendent channels capable of accurate absolute optical power measurements. Often, it is desirable to measure the relative gain or absorbance across an optical network element, such as an optical amplifier or variable attenuator. If each channel has identical logarithmic slopes and intercepts, this can easily be done by differencing the output signals of each channel. In reality, channel mismatch can result in significant errors over a wide range of input levels if left uncompensated. Postprocessing of the signal can be used to account for individual channel characteristics. This requires a simple calculation of the expected input level for a measured log voltage, followed by differencing of the two signal levels in the digital domain for a relative gain or absorbance measurement. A more straight- forward analog implementation includes the use of a current mirror, as shown in Figure 37. The current mirror is used to feed an opposite polarity replica of the cathode photocurrent of PD2 into Channel 2 of the ADL5310. This allows one channel to be used as an absolute power meter for the optical signal incident on PD2, while the opposite channel is used to directly compute the log ratio of the two input signals. 5V IPD2 IIN2=IPD2 IIN1 TEMPERATURE COMPENSATION BIAS GENERATOR 1k Ω 2M Ω 4.7nF 1k Ω 4.7nF 0.1 µF 1k Ω 4.7nF 1nF 1nF 0.1 µF 1nF 1nF VNEG COMM COMM VREF VRDZ VPOS VSUM INP1 PD1 InGaAs PIN 1k Ω 4.7nF PD2 InGaAs PIN IRF1 ILOG1 OUT1 SCL1 BIN1 LOG1 TEMPERATURE COMPENSATION COMM log log log log 5V VSUM 5V INP2 IRF2 ILOG2 OUT2 Φ 2* α 21** * Φ 2(V) ≅ 0.2log10() SCL2 BIN2 LOG2 IIN2 100pA ** α 21(V) ≅ 0.2log10() IIN1 IPD2 ADL5310 Figure 37. Absolute and Relative Power Measurement Application Using Modified Wilson Current Mirror The presented current mirror is a modified Wilson mirror. Other current mirror implementations would also work, though the modified Wilson mirror provides fairly constant perfor- mance over temperature. It is essential to use matched pair transistors when designing the current mirror to minimize the effects of temperature gradients and beta mismatch. |
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