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TL431CS 数据表(PDF) 3 Page - Analog Intergrations Corporation |
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TL431CS 数据表(HTML) 3 Page - Analog Intergrations Corporation |
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3 / 11 page ![]() AIC431/TL431A/TL431 3 n TEST CIRCUITS VREF IREF IZ VZ IL IN AIC431 R2 R1 VREF IREF IZ VZ IN IL AIC431 Note: VZ=VREF(1+R1/R2)+IREFxR1 Fig. 1 Test Circuit for VZ=VREF Fig. 2 Test circuit for VZ>VREF IN VZ IZ(OFF) AIC431 Fig. 3 Test circuit for off-state Current n ELECTRICAL CHARACTERISTICS (Ta=25°C, unless otherwise specified.) PARAMETER TEST CONDITIONS SYMBOL MIN. TYP. MAX. UNIT VZ=VREF, AIC431 2.482 2.495 2.508 IL =10mA (Fig. 1) TL431A 2.470 2.495 2.520 Reference Voltage TL431 VREF 2.455 2.495 2.535 V Deviation of Reference Input Voltage Over Temperature (Note 3) VZ = VREF , IL =10mA, Ta = 0 °C~ +85°C (Fig. 1) VDEV 9.0 20 mV Ratio of the Change in Refer- ence Voltage to IZ=10mA ∆V Z=10V-VREF -0.5 -2.0 mV/V the Change in Cathode volt- age (Fig. 2) ∆V Z=30V-10V ∆V REF ∆V Z -0.35 -1.5 mV/V Reference Input Current R1 =10K Ω, R2=∞, IL =10mA (Fig. 2) IREF 0.8 3.5 µA |
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