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AD5245BRJ10-R2 数据表(PDF) 12 Page - Analog Devices |
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AD5245BRJ10-R2 数据表(HTML) 12 Page - Analog Devices |
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12 / 20 page ![]() AD5245 Rev. B | Page 12 of 20 TEST CIRCUITS Figure 28 to Figure 34 illustrate the test circuits that define the test conditions used in the product specification tables (Table 1 through Table 3). VMS A W B DUT V+ V+ = VDD 1LSB = V+/2N Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 29. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS2 VMS1 VW A W B DUT IW = VDD/RNOMINAL RW = [VMS1 – VMS2]/IW Figure 30. Test Circuit for Wiper Resistance ∆VMS% DD% PSS (%/%) = V+ = VDD ±10% PSRR (dB) = 20 log MS DD ( ) VDD VA VMS A W B V+ ∆V ∆V ∆V Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR) +15V –15V W A 2.5V B VOUT OFFSET GND DUT AD8610 VIN Figure 32. Test Circuit for Gain vs. Frequency W B GND TO VDD DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V Figure 33. Test Circuit for Incremental On Resistance W B VCM ICM A NC GND NC VDD DUT NC = NO CONNECT Figure 34. Test Circuit for Common-Mode Leakage Current |
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