5/4/98

Am29F800B Known Good Die

9

SU PP L E ME NT

REVISION SUMMARY FOR AM29F800B KGD

Revision A+1, A+2

Distinctive Characteristics

Changed typical program/erase time to 30 mA to match

the CMOS DC Characteristics table in the Am29F400B

full data sheet.

The minimum guarante per sector is now 1 million

cycles.

Pad Description

Corrected the following dimensions:

X (mils): pads 15, 18, 36

Y (mils): pads 10–12, 35, 36

X (mm): pads 2–22, 37, 38

Y (mm): pads 10–12, 23–32, 35, 36

Physical Specifications

Changed die thickness specification to ~20 mils.

Trademarks

Copyright © 1998 Advanced Micro Devices, Inc. All rights reserved.

AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.

Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.