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STM32L151VD 数据表(PDF) 113 Page - STMicroelectronics

部件名 STM32L151VD
功能描述  Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 384KB Flash
PDF  140 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32L151VD 数据表(HTML) 113 Page - STMicroelectronics

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STM32L151xD STM32L152xD
Electrical characteristics
Doc ID 022027 Rev 6
113/140
Table 65.
ADC accuracy(1)(2)
Symbol
Parameter
Test conditions
Min(3)
Typ
Max(3)
Unit
ET
Total unadjusted error
2.4 V
≤ VDDA ≤ 3.6 V
2.4 V
≤ VREF+ ≤ 3.6 V
fADC = 8 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
-2
4
LSB
EO
Offset error
-
1
2
EG
Gain error
-
1.5
3.5
ED
Differential linearity error
-
1
2
EL
Integral linearity error
-
1.7
3
ENOB
Effective number of bits
2.4 V
≤ VDDA ≤ 3.6 V
VDDA = VREF+
fADC = 16 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
1 kHz
≤ Finput ≤ 100 kHz
9.2
10
-
bits
SINAD
Signal-to-noise and
distortion ratio
57.5
62
-
dB
SNR
Signal-to-noise ratio
57.5
62
-
THD
Total harmonic distortion
-74
-75
-
ET
Total unadjusted error
2.4 V
≤ VDDA ≤ 3.6 V
1.8 V
≤ VREF+ ≤ 2.4 V
fADC = 4 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
-4
6.5
LSB
EO
Offset error
-
2
4
EG
Gain error
-
4
6
ED
Differential linearity error
-
1
2
EL
Integral linearity error
-
1.5
3
ET
Total unadjusted error
1.8 V
≤ VDDA ≤ 2.4 V
1.8 V
≤ VREF+ ≤ 2.4 V
fADC = 4 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
-2
3
LSB
EO
Offset error
-
1
1.5
EG
Gain error
-
1.5
2
ED
Differential linearity error
-
1
2
EL
Integral linearity error
-
1
1.5
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC accuracy vs. negative injection current: Injecting a negative current on any analog input pins should be avoided as this
significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a
Schottky diode (pin to ground) to analog pins which may potentially inject negative currents.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.12 does not affect the ADC
accuracy.
3.
Based on characterization, not tested in production.



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