1

2

3

4

5

6

7

14

13

12

11

10

9

8

2OUT

1OUT

1IN–

1IN+

2IN–

2IN+

3OUT

3IN–

4IN+

GND

4IN–

3IN+

4OUT

LMV339 . . . D OR PW PACKAGE

(TOP VIEW)

LMV393 . . . D, DDU, DGK OR PW PACKAGE

(TOP VIEW)

1

2

3

4

8

7

6

5

1OUT

1IN–

1IN+

GND

2OUT

2IN–

2IN+

LMV331 . . . DBV OR DCK PACKAGE

(TOP VIEW)

OUT

1

2

3

5

4

1IN+

GND

1IN–

LMV339 . . . RUC PACKAGE

(TOP VIEW)

1

2

3

4

5

12

11

10

9

8

7

6

14

13

1OUT

1IN–

1IN+

2IN–

4IN+

GND

4IN–

3IN+

4OUT

LMV331 SINGLE

LMV393 DUAL

LMV339 QUAD

www.ti.com

SLCS136S – AUGUST 1999 – REVISED OCTOBER 2012

GENERAL-PURPOSE LOW-VOLTAGE COMPARATORS

1

FEATURES

•

2.7-V and 5-V Performance

•

Low Supply Current

–

LMV331 . . . 130

μA Typ

–

LMV393 . . . 210

μA Typ

–

LMV339 . . . 410

μA Typ

•

Input Common-Mode Voltage Range Includes

Ground

•

Low Output Saturation Voltage 200 mV Typical

•

Open-Collector Output for Maximum Flexibility

DESCRIPTION/

ORDERING INFORMATION

The LMV393 and LMV339 devices are low-voltage

(2.7 V to 5.5 V) versions of the dual and quad

comparators, LM393 and LM339, which operate from

5 V to 30 V. The LMV331 is the single-comparator

version.

The LMV331, LMV339, and LMV393 are the most

cost-effective solutions for applications where low-

voltage operation, low power, space saving, and price

are the primary specifications in circuit design for

portable consumer products. These devices offer

specifications that meet or exceed the familiar LM339

and LM393 devices at a fraction of the supply current.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2012, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.