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LPV521 数据表(PDF) 3 Page - Texas Instruments |
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LPV521 数据表(HTML) 3 Page - Texas Instruments |
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3 / 29 page  LPV521 www.ti.com SNOSB14C – AUGUST 2009 – REVISED FEBRUARY 2013 1.8V DC Electrical Characteristics (1) Unless otherwise specified, all limits guaranteed for TA = 25°C, V + = 1.8V, V− = 0V, V CM = VO = V +/2, and R L > 1 MΩ. Boldface limits apply at the temperature extremes. Min Typ Max Symbol Parameter Conditions Units (2) (3) (2) VOS Input Offset Voltage VCM = 0.3V 0.1 ±1.0 ±1.23 mV 0.1 ±1.0 VCM = 1.5V ±1.23 TCVOS Input Offset Voltage Drift(4) ±0.4 ±3 μV/°C IBIAS Input Bias Current 0.01 ±1 pA ±50 IOS Input Offset Current 10 fA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 1.8V 66 92 60 75 101 0V ≤ VCM ≤ 0.7V dB 74 75 120 1.2V ≤ VCM ≤ 1.8V 53 PSRR Power Supply Rejection Ratio 1.6V ≤ V+ ≤ 5.5V 85 109 dB VCM = 0.3V 76 CMRR ≥ 67 dB 0 1.8 V CMVR Common Mode Voltage Range CMRR ≥ 60 dB 0 1.8 VO = 0.5V to 1.3V 74 125 dB AVOL Large Signal Voltage Gain RL = 100 kΩ to V +/2 73 VO Output Swing High RL = 100 kΩ to V +/2 2 50 VIN(diff) = 100 mV 50 mV from either rail Output Swing Low RL = 100 kΩ to V +/2 2 50 VIN(diff) = −100 mV 50 IO Sourcing, VO to V – 1 3 VIN(diff) = 100 mV 0.5 Output Current(5) mA Sinking, VO to V + 1 3 VIN(diff) = −100 mV 0.5 IS Supply Current VCM = 0.3V 345 400 580 nA 472 600 VCM = 1.5V 850 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are guaranteed by testing, statistical analysis or design. (3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material. (4) The offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change. (5) The short circuit test is a momentary open loop test. Copyright © 2009–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LPV521 |
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