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I2CSTAT 数据表(PDF) 149 Page - Microchip Technology |
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I2CSTAT 数据表(HTML) 149 Page - Microchip Technology |
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149 / 210 page ![]() © 2010 Microchip Technology Inc. DS70139G-page 149 dsPIC30F2011/2012/3012/3013 20.0 ELECTRICAL CHARACTERISTICS This section provides an overview of dsPIC30F electrical characteristics. Additional information will be provided in future revisions of this document as it becomes available. For detailed information about the dsPIC30F architecture and core, refer to the “dsPIC30F Family Reference Manual” (DS70046). Absolute maximum ratings for the dsPIC30F family are listed below. Exposure to these maximum rating conditions for extended periods may affect device reliability. Functional operation of the device at these or any other conditions above the parameters indicated in the operation listings of this specification is not implied. Absolute Maximum Ratings(†) Ambient temperature under bias............................................................................................................ .-40°C to +125°C Storage temperature .............................................................................................................................. -65°C to +150°C Voltage on any pin with respect to VSS (except VDD and MCLR) (Note 1) ..................................... -0.3V to (VDD + 0.3V) Voltage on VDD with respect to VSS ......................................................................................................... -0.3V to +5.5V Voltage on MCLR with respect to VSS........................................................................................................ 0V to +13.25V Maximum current out of VSS pin ...........................................................................................................................300 mA Maximum current into VDD pin (Note 2)................................................................................................................ 250 mA Input clamp current, IIK (VI < 0 or VI > VDD) .......................................................................................................... ±20 mA Output clamp current, IOK (VO < 0 or VO > VDD) ................................................................................................... ±20 mA Maximum output current sunk by any I/O pin..........................................................................................................25 mA Maximum output current sourced by any I/O pin ....................................................................................................25 mA Maximum current sunk by all ports ....................................................................................................................... 200 mA Maximum current sourced by all ports (Note 2).................................................................................................... 200 mA Note 1: Voltage spikes below VSS at the MCLR/VPP pin, inducing currents greater than 80 mA, may cause latch-up. Thus, a series resistor of 50-100 Ω should be used when applying a “low” level to the MCLR/VPP pin, rather than pulling this pin directly to VSS. 2: Maximum allowable current is a function of device maximum power dissipation. See Table 20-2 for PDMAX. †NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. Note: All peripheral electrical characteristics are specified. For exact peripherals available on specific devices, please refer to the dsPIC30F2011/2012/3012/3013 Sensor Family table on page 4 of this data sheet. |
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