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LP2951CDMR2 数据表(PDF) 3 Page - ON Semiconductor

部件名 LP2951CDMR2
功能描述  100 mA, Low Power Low Dropout Voltage Regulator
PDF  22 Pages
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

LP2951CDMR2 数据表(HTML) 3 Page - ON Semiconductor

  LP2951CDMR2 Datasheet HTML 1Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 2Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 3Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 4Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 5Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 6Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 7Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 8Page - ON Semiconductor LP2951CDMR2 Datasheet HTML 9Page - ON Semiconductor Next Button
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LP2950, LP2951, NCV2951
http://onsemi.com
3
MAXIMUM RATINGS (TA = 25C, unless otherwise noted.)
Rating
Symbol
Value
Unit
Input Voltage
VCC
30
Vdc
Peak Transient Input Voltage (t < 20 ms)
VCC
32
Vdc
Power Dissipation and Thermal Characteristics
Maximum Power Dissipation
PD
Internally Limited
W
Case 751(SOIC−8) D Suffix
Thermal Resistance, Junction−to−Ambient
RqJA
180
C/W
Thermal Resistance, Junction−to−Case
RqJC
45
C/W
Case 369A (DPAK) DT Suffix (Note 1)
Thermal Resistance, Junction−to−Ambient
RqJA
92
C/W
Thermal Resistance, Junction−to−Case
RqJC
6.0
C/W
Case 29 (TO−226AA/TO−92) Z Suffix
Thermal Resistance, Junction−to−Ambient
RqJA
160
C/W
Thermal Resistance, Junction−to−Case
RqJC
83
C/W
Case 626 N Suffix
Thermal Resistance, Junction−to−Ambient
RqJA
105
C/W
Case 846A (Micro8) DM Suffix
Thermal Resistance, Junction−to−Ambient
RqJA
240
C/W
Feedback Input Voltage
Vfb
−1.5 to +30
Vdc
Shutdown Input Voltage
Vsd
−0.3 to +30
Vdc
Error Comparator Output Voltage
Verr
−0.3 to +30
Vdc
Operating Ambient Temperature Range
TA
−40 to +125
C
Maximum Die Junction Temperature Range
TJ
+150
C
Storage Temperature Range
Tstg
−65 to +150
C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.



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