74LVC00A

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© NXP B.V. 2012. All rights reserved.

Product data sheet

Rev. 7 — 25 April 2012

6 of 14

NXP Semiconductors

74LVC00A

Quad 2-input NAND gate

Test data is given in Table 8. Definitions for test circuit:

Fig 7.

Load circuitry for measuring switching times

10 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

001aaf615

DUT

CL

RT

RL

PULSE

GENERATOR

Table 8.

Test data

Supply voltage

Input

Load

1.2 V

≤ 2 ns

30 pF

1 k

Ω

1.65 V to 1.95 V

≤ 2 ns

30 pF

1 k

Ω

2.3 V to 2.7 V

≤ 2 ns

30 pF

500

Ω

2.7V

2.7V

≤ 2.5 ns

50 pF

500

Ω

3.0Vto 3.6V

2.7V

≤ 2.5 ns

50 pF

500

Ω