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7

LSO SERIES

28V Input, Single/Dual Output

1.

Parameter is tested as part of design characterization or after design changes. Thereafter, parameter

shall be guaranteed to the limits specified.

2.

Parameter verified during line and load regulation tests.

3.

Output load current must be distributed such that at least 20% of the total load current is being provided by

one of the outputs.

4.

Load current split equally between outputs on dual output models.

5.

Cross regulation is measured with 20% rated load on output under test while changing the load on the

other output from 20% to 80% of rated.

6.

Guaranteed for a D.C. to 20MHz bandwidth. Tested using a 20KHz to 10MHz bandwidth using the circuit

shown in Fig.1.

7.

Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. For

a capacitive load in excess of the maximum limit, consult the factory.

8.

90% of nominal.

9.

Load step transition time

≤ 10µs.

its steady state value.

11. Line step transition time

≤ 100µs.

12. Turn-on delay time from either a step application of input power or a logic low to a logic high transition on

13. End of ife (EOL) is

±3%

14. MIL-HDBK MOSFET failure rates replaced by empirical failure rate data supplied by Intenational Rectifier.

Radiation Performance Characteristics

Fig. 1 - Circuit for measuring Output Ripple Voltage

2XWSXW

'87

5HWXUQ

50

Ω

0.1 F

µ

1 F

µ

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v‡uà ÃHC“Ãihqvq‡uÃ

€ˆy‡vƒy’Ã…rhqvtÃi’Ã!

50

Ω

Termination

Test Inspection

Method

Min

Typ

Unit

MIL-PRF-883, Method 1019

Total Ionizing Dose (Gamma)

Operating bias applied during exposure,

100

150

Krads(Si)

Heavy Ions (LET)

Single Event Effects

Operating bias applied during exposure,

SEU, SEL, SEGR, SEB

82

Test lab: Cyclotron Institute

Texas A & M University