CAT28HT256 datasheet(2/10 Pages) CATALYST

2 / 10 page

CAT28HT256

8-92

Advanced

Stock No. 21065-03 2/98

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min.

Max.

Units

Test Method

NEND(1)

Endurance

104 or 105

Cycles/Byte

MIL-STD-883, Test Method 1033

TDR(1)

Data Retention

100

Years

MIL-STD-883, Test Method 1008

VZAP(1)

ESD Susceptibility

2000

Volts

MIL-STD-883, Test Method 3015

ILTH(1)(2)

Latch-Up

100

JEDEC Standard 17

5096 FHD F01

CERDIP Package (D)

PIN CONFIGURATION

PIN FUNCTIONS

Pin Name

Function

A0–A14

Address Inputs

I/O0–I/O7

Data Inputs/Outputs

Chip Enable

Output Enable

Write Enable

VCC

5V Supply

VSS

Ground

No Connect

I/O2

VSS

I/O6

I/O5

I/O0

I/O1

A10

I/O7

A14

A12

A11

VCC

A13

I/O4

I/O3

MODE SELECTION

Mode

I/O

Power

Read

DOUT

ACTIVE

Byte Write (WE Controlled)

DIN

ACTIVE

Byte Write (CE Controlled)

DIN

ACTIVE

Standby, and Write Inhibit

High-Z

STANDBY

Read and Write Inhibit

High-Z

ACTIVE

CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V

Symbol

Test

Max.

Units

Conditions

CI/O(1)

Input/Output Capacitance

VI/O = 0V

CIN(1)

Input Capacitance

VIN = 0V

Note:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(2) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC +1V.

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