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AP-CF016GA5GS-RM 数据表(PDF) 9 Page - List of Unclassifed Manufacturers

部件名 AP-CF016GA5GS-RM
功能描述  Compact Flash 4 Series
PDF  23 Pages
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制造商  ETC2 [List of Unclassifed Manufacturers]
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标志 ETC2 - List of Unclassifed Manufacturers

AP-CF016GA5GS-RM 数据表(HTML) 9 Page - List of Unclassifed Manufacturers

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Compact Flash 4 series
AP-CFxxxxA5XS-XXXXXX
8
© 2009 Apacer Technology Inc.
Rev. 1.1
5. Flash Management
5.1 Advanced Wear Leveling
The goal of advanced wear leveling algorithms is to evenly spread the program and erase cycles on the
area of programmed and erased multiple times and the area of programmed one and read multiple times
among the available blocks in the flash array.
5.2 Read Recovery Technology
Read Recovery Technology enables reliable storage. When it is detected correctable error during read
command operation, all data of related block is corrected and is moved to other block. Since it continues
to read data after recovery operation, read data is the same as no error data for host system. However,
since data transfer is stopped temporarily, the output time of BSY signal becomes long. In order to
perform Read Command Recovery, it is necessary to set up the threshold for the number of detected
error bit. Read Command Recovery is performed by following commands.
READ DMA
READ MULTIPLE
READ SECTOR(S)
READ VERIFY SECTOR(S)
5.3 Power Failure Recovery
The controller enables to reduce data loss in case of sudden power fail. Once power was failure before
cached data writing back into flash, data in the cache will lost. The next time the power is on, the
controller will check these fragmented data segment, and, if necessary, replace them with old data kept in
flash until programmed successfully.
5.4 S.M.A.R.T. Technology
S.M.A.R.T. is an acronym for Self-Monitoring, Analysis and Reporting Technology and enables to expect
the endurance of flash memory. The S.M.A.R.T. function protects the user from unexpected fault of
product. The S.M.A.R.T function enables to predict the occurrence of near-term degradation or fault
conditions by monitoring and storing critical parameters of flash memory (ex. Number of bad block,
maximum number of erase, etc). The host system is warned of a negative reliability condition which is the
impending risk of data loss by the S.M.A.R.T. function. Then the user can take appropriate action to
minimize the risk.



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