MAS3691FC datasheet(40/41 Pages) DYNEX

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RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

GEC Plessey Semiconductors can provide radiation

testing compliant with Mil-Std-883 test method 1019, Ionizing

Radiation (Total Dose).

Total Dose (Function to specification)*

3x10

5 Rad(Si)

Transient Upset (Stored data loss)

5x10

10 Rad(Si)/sec

Transient Upset (Survivability)

>1x10

12 Rad(Si)/sec

Neutron Hardness (Function to specification)

>1x10

15 n/cm2

Single Event Upset**

<1x10

-10 Errors/bit day

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 44: Radiation Hardness Parameters

ORDERING INFORMATION

Unique Circuit Designator

Radiation Hard Processing

100 kRads (Si) Guaranteed

300 kRads (Si) Guaranteed

1000 kRads (Si) Guaranteed

Radiation Tolerance

Ceramic DIL (Solder Seal)

Flatpack (Solder Seal)

Naked Die

Package Type

QA/QCI Process

(See Section 9 Part 4)

Test Process

(See Section 9 Part 3)

Assembly Process

(See Section 9 Part 2)

Rel 0

Rel 1

Rel 2

Rel 3/4/5/STACK

Class B

Class S

Reliability Level

MAx3690xxxxx

MAx3691xxxxx

MAx3693Cxxxx

For details of reliability, QA/QC, test and assembly

options, see ‘Manufacturing Capability and Quality

Assurance Standards’ Section 9.

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