| 数据搜索系统,热门电子元器件搜索 |
|
MB84VB2000 数据表(PDF) 13 Page - fujitsu semiconductor |
|
|
|||||||||||||||||||||||||||||
MB84VB2000 数据表(HTML) 13 Page - fujitsu semiconductor |
|
13 / 28 page ![]() 13 MB84VB2000-10/MB84VB2001-10 s AC CHARACTERISTICS •CE Timing • Read Only Operations Characteristics Note: Test Conditions–Output Load: 1 TTL gate and 30 pF Input rise and fall times: 5 ns Input pulse levels: 0.0 V to 3.0 V Timing measurement reference level Input: 1.5 V Output: 1.5 V Parameter Symbols Description Test Setup -10 Unit JEDEC Standard —tCCR CE Recover Time — Min. 0 ns Parameter Symbols Description Test Setup -10 (Note) Unit JEDEC Standard Min. Max. tAVAV tRC Read Cycle Time — 100 — ns tAVQV tACC Address to Output Delay CE = VIL OE = VIL —100 ns tELQV tCE Chip Enable to Output Delay OE = VIL —100 ns tGLQV tOE Output Enable to Output Delay — — 40 ns tEHQZ tDF Chip Enable to Output High-Z — — 30 ns tGHQZ tDF Output Enable to Output High-Z — — 30 ns tAXQX tOH Output Hold Time from Addresses, CE or OE, Whichever Occurs First —0 — ns —tREADY RESET Pin Low to Read Mode — — 20 µs — tELFL tELFH CE or BYTE Switching Low or High — — 5 ns |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |