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GL494 数据表(PDF) 4 Page - Hynix Semiconductor |
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GL494 数据表(HTML) 4 Page - Hynix Semiconductor |
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4 / 7 page ![]() GL494 4 Output Section PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT Collector off-state current V 40 V , V 40 V CC CE = = 2 100 mA Emitter off-state current 0 V , V 40 V V E C CC = = = -100 mA Common-emitter mA 200 I , 0 V C E = = 1.1 1.3 Collector-emitter Saturation voltage Emitter-follower mA 200 I , V 15 V E C − = = 1.5 2.5 V Output control input current ref I V V = 3.5 mA Total Device PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT V 15 VCC = 6 10 mA Standby supply current All other inputs & Outputs open V 40 VCC = 9 15 mA Average supply current V 2 V ) 4 pin ( = See Test circuit 1 7.5 mA Notes: (1) All typical values except for temperature coefficients are at C 25 T A ° = (2) Duration of the short circuit should not exceed one second. (3) Standard deviation is a measure of the statistical distribution about the mean as derived from the formula 1 N ) X X ( N 1 n 2 n − − = σ ∑ = |
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