IDT6167LA55DB datasheet(5/8 Pages) IDT

5 / 8 page

5.2

IDT6167SA/LA

CMOS STATIC RAM 16K (16K x 1-BIT)

MILITARY AND COMMERCIAL TEMPERATURE RANGES

AC TEST CONDITIONS

Input Pulse Levels

GND to 3.0V

Input Rise/Fall Times

5ns

Input Timing Reference Levels

1.5V

Output Reference Levels

1.5V

AC Test Load

See Figures 1 and 2

2981 tbl 10

Figure 2. AC Test Load

(for tCLZ, tCHZ, tWHZ and tOW)

*Includes scope and jig.

Figure 1. AC Test Load

2981 drw 04

480

Ω

30pF*

255

Ω

DATAOUT

2981 drw 05

480

Ω

5pF*

255

Ω

DATAOUT

AC ELECTRICAL CHARACTERISTICS (VCC = 5.0V

± 10%, All Temperature Ranges)

6167SA15

6167SA20/25 6167SA35/45

(1) 6167SA55(1)/70(1)

6167LA15

6167LA20/25 6167LA35/45

(1) 6167LA55(1)/70(1)

Symbol

Parameter

Min.

Max.

Min. Max.

Min.

Max.

Min.

Max.

Unit

Read Cycle

tRC

Read Cycle Time

—

20/25

—

35/45

—

55/70

—

tAA

Address Access Time

—

20/25

—

35/45

—

55/70

tACS

Chip Select Access Time

—

20/25

—

35/45

—

55/70

tCLZ

(2)

Chip Deselect to Output in Low-Z

—

5/5

—

5/5

—

5/5

—

tCHZ

(2)

Chip Select to Output in High-Z

—

10/10

—

15/30

—

40/40

tOH

Output Hold from Address Change

—

5/5

—

5/5

—

5/5

—

tPU

(2)

Chip Select to Power-Up Time

—

0/0

—

0/0

—

0/0

—

tPD

(2)

Chip Deselect to Power-Down Time

—

20/25

—

35/45

—

55/70

Write Cycle

tWC

Write Cycle Time

—

20/20

—

30/45

—

55/70

—

tCW

Chip Select to End-of-Write

—

15/20

—

30/40

—

45/55

—

tAW

Address Valid to End-of-Write

—

15/20

—

30/40

—

45/55

—

tAS

Address Set-up Time

—

0/0

—

0/0

—

0/0

—

tWP

Write Pulse Width

—

15/20

—

30/30

—

35/40

—

tWR

Write Recovery Time

—

0/0

—

0/0

—

0/0

—

tDW

Data Valid to End-of-Write

—

12/15

—

17/20

—

25/30

—

tDH

Data Hold Time

—

0/0

—

0/0

—

0/0

—

tWHZ

(2)

Write Enable to Output in High-Z

—

8/8

—

15/30

—

40/40

tOW

(2)

Output Active from End-of-Write

—

0/0

—

0/0

—

0/0

—

NOTES:

2981 tbl 11

1. –55

°C to +125°C temperature range only. Also available: 85ns and 100ns Military devices.

2. This parameter is guaranteed with AC Load (Figure 2) by device characterization, but is not production tested.

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