DocID024464

Rev 2

23/27

AN4287

Further information

Appendix A

Further information

5.5

Conventions and terminology

Table 2 shows the list of conventions for this document.

5.6

Acronyms and abbreviations

A short list of acronyms and abbreviations used in this document is reported in the following

Table 3.

Table 2. List of conventions and terminology

Convention

Description

Error

Discrepancy between a computed, observed, or measured value or condition and

the true, specified or theoretically correct value or condition.

Fault

Abnormal condition that may cause a reduction in, or loss of, the capability of a

functional unit to perform a required function.

Failure

The termination of the ability of a functional unit to perform a required function.

Table 3. Acronyms and abbreviations

Term

Meaning

CCF

Common Cause Failure

CRC

Cyclic Redundancy Check

DED

Dual Error Detection

ECC

Error Correcting Code

ECSM

Error Correction Status Module

eDMA

Enhanced Direct Memory Access

EXWD

External Watchdog function

eQADC

Enhanced Queued Analog-to-Digital Converter

FMEDA

Failure Modes, Effects and Diagnostic Analysis

FMPLL

Frequency-Modulated Phase-Locked Loop

FOM

Failure Output Monitor function

FTTI

Fault Tolerant Time Interval

GPIO

General Purpose Input/Output

LBIST

Logic Built-In Self-Test

LVI

Low Voltage Inhibit

MBIST

Memory Built-In Self-Test

MCU

Microcontroller Unit

MPU

Memory Protection Unit