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AN4371 数据表(PDF) 13 Page - STMicroelectronics |
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AN4371 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 29 page ![]() DocID025337 Rev 1 13/29 AN4371 ADC built-in self-test algorithms 28 Figure 6. ADC self-test Algorithm S 2.2.1 Supply self-test in CPU mode To properly execute supply self-test it is required to use ADC in scan mode. The scan mode is requested for S algorithm, because S1 (ratio) result is based on S0 result. If these |
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