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TN0436 数据表(PDF) 5 Page - STMicroelectronics |
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TN0436 数据表(HTML) 5 Page - STMicroelectronics |
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5 / 10 page ![]() TN0436 Differences cut1 and cut2 Doc ID 18327 Rev 2 5/10 e5301PS RGM MC_RGM: SAFE mode exit may be possible even though condition causing the SAFE mode request has not been cleared. e6041PS ME MC_ME: peripherals in unknown state after SAFE mode exit. e6440PS MC SWT interrupt does not cause STOP0 mode exit. e6699PS CGM MC_CGM: short glitch may occur on output clock. e7583 PS RGM MC_RGM: RGM_FES content incorrect after startup LBIST execution. e8291PS CGM System clock source change may cause a "CMU0 system clock frequency too high or too low event". e9367PS eTimer eTimer: configuring an eTimer counter channel in GATED- COUNT mode or in SIGNED-COUNT mode it may cause a possible incorrect counting of 1 tick. e9414PS eTimer Possible false DMA requests from eTimer. e6886PS NPC MCKO clock gating not implemented. e9376 PS PWM FlexPWM: configuring the count value to set PWMA/PWMB first low and then high in the same cycle the output signals are low. e6309PS SSCM Debugging functionality could be lost when unsecuring a secured device. e6500PS ADC VREFP and VDD_HV_ADC power up sequencing constraint. e5485PS ADC ADC: ADC_DMAE[DCLR] should not be used. e9154 PS ADC ADC: abort request during last sampling cycle corrupts the data register of next channel conversion. e1685PS FMPLL FMPLL: FMPLL_CR[UNLOCK_ONCE] wrongly set. e7220PS SWG SWG: SGEN_CTRL.NRO bit is reserved *). e5816PS SWG SWG: Sinewave generator (SWG) is active during self-test execution. e26553IPG e200z4 e200z4: mtlr followed by se_rfi/se_rfci/se_rfdi/se_rfmci can give unexpected results. e8099 PS DMA Limiations for DMA access to LINFlex. e9471 PS IPBUS CAN Register/Message Buffer Access can reset or block the device if certain clock divider ratios (PeriN: System Clock) are selected. e7752PS Platform ICache commands ICBTLS and ICBLC do not work as specified. Table 2. Errata for cut1 and the fixes for cut2 (continued) Errata number Module Description |
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