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UPD17P236 数据表(PDF) 12 Page - NEC |
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UPD17P236 数据表(HTML) 12 Page - NEC |
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12 / 32 page ![]() µPD17P236 12 Data Sheet U14776EJ1V0DS00 2.4 Processing of Unused Pins Process the unused pins as follows: Table 2-1. Processing of Unused Pins Pin Recommended Connection P0A0-P0A3 Leave open. P0B0-P0B3 P0C0-P0C3 P0D0-P0D3 P0E0-P0E3 Input : Individually connect to VDD or GND via resistor. Output : Leave open. P1A0 Connect to GND. REM Leave open. INT Connect to GND. IC1, IC2 These pins cannot be used. Leave open. 2.5 Notes on Using the RESET and INT Pins In addition to the functions shown in 2. PIN FUNCTIONS, the RESET pin also has the function of setting a test mode (for IC testing) in which the internal operations of the µPD17P236 are tested. When a voltage higher than VDD is applied to either of these pins, the test mode is set. This means that, even during normal operation, the µPD17P236 may be set in the test mode if noise exceeding VDD is applied. For example, if the wiring length of the RESET or INT pin is too long, noise superimposed on the wiring line of the pin may cause the above problem. Therefore, keep the wiring length of these pins as short as possible to suppress the noise; otherwise, take noise preventive measures as shown below by using external components. • Connect diode with low VF between VDD • Connect capacitor between VDD and RESET/INT pin and RESET/INT pin VDD VDD RESET, INT VDD VDD RESET, INT Diode with low VF |
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