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AN576 数据表(PDF) 2 Page - STMicroelectronics |
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AN576 数据表(HTML) 2 Page - STMicroelectronics |
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2 / 6 page ![]() AN576 2/6 Figure 2. Recommended protection location In this case the current due to the clamping phase of P remains located in the disturbance area and the track B is not affected. To summarize, it is recommended that the protection device is located as close as possible the distur- bance source. For example, all the lines coming into the board ought to be protected close to the connec- tor. INFLUENCE OF THE PCB LAYOUT ON THE ESD PROTECTION These days, printed circuit boards are often auto-routed by computer aided design and the track lengths are not optimized. Figure 3. Non-optimized LAYOUT for ESD Figure 3 shows the classical non-optimized layout. When a surge occurs the protection device P acts and there is a clamping voltage VCL across it. Due to the fast rise time of the ESD overvoltage there is a high di/dt between the points A and B. This di/dt generates, in the parasitic inductances located between A and P and between B and P, overvoltages up to several hundred volts. So the applied voltage V across the device to be protected is the sum of the clamping voltage and the voltage across the parasitic inductance: thus the sensitive module is not protected. P I Track B Track A V CL DEVICE TO BE PROTECTED DISTURBANCE SOURCE DISTURBANCE SOURCE A P U B DEVICE TO BE PROTECTED |
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