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AN2482 数据表(PDF) 13 Page - STMicroelectronics |
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AN2482 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 18 page  AN2482 Electromagnetic compatibility (EMC) requirements 13/18 Table 2. PCLT Immunity tests results Minimum requirements of international standards Robustness of the PCLT demo board Test conditions Levels Tests conditions Levels behavior of the PCLT ESD test IEC61000-4-2 Air discharge ±8 kV RC = 2.2 kΩ RIN = 750 Ω ±15 kV No failure, no disturbance. Contact discharge ±4 kV RC = 2.2 kΩ RIN = 750 Ω ±8 kV Burst test IEC61000-4-4 Analog Input ±1kV RIN = 750 Ω C IN = 22 nF CC =33 nF ±4 kV No failure, no disturbance. DC power line ±2 kV RC = 2.2 kΩ Surge test IEC61000-4-5 Analog Input 42 Ω: 0.5 µF differential and common mode ±0.5 kV Analog Input RIN = 750 Ω ±0.5 kV No failure, temporary disturbance. RIN = 1.2 kΩ ±1 kV dc power line 2 Ω; 18 µF differential mode ±0.5 kV dc power line RC = 2.2 k ±1 kV 12 Ω; 9 µF common mode ±1 kV ±1 kV Conducted disturbance test IEC61000-4-6 150 kHz to 80 MHz 22 nF capacitors 3 Vrms AM±80% 150 kHz to 80 MHz RIN = 750 Ω C = 22 nF At the input 10 Vrms AM±80% No failure, No disturbance. Reverse input polarity test -Vcc applied to one input during 10 s -30 Vdc applied to one input, +30 Vdc on the others No failure |
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