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ST7 SERIAL TEST CONTROLLER PROGRAMMING

Figure 1. User Board

Now, let’s define the pins used for programming the ST7. These pins are put together in the

W1 connector implemented in all the ST programming tool boards (see Section 3 APPENDIX

1 for the pin connector assignment).

All the ST7 programming tools referred to in this note (ST7 starter kits and ST7 EPBs in the

MDT1, MDT3 and MDT4 tool families) use a programming technique called JTAG (Joint Test

Action Group).

These programming tools control 11 pins:

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5 JTAG pins and 3 test mode pins, which are used for loading the software code into the

ST7. These pins are:

– Pin TCK: the test clock (input),

– Pin TMS: the Test Mode Select (input, weak pull-up),

– Pin TRST0: the Reset (Input, weak pull-up, active low)

– Pin TDI: the Test Data In (input, weak pull-up). This is the serial data input, sampled on

the rising edge of TCK.

– Pin TDO: the Test Data Out (tri-state output). This is the serial data output, updated on the

falling edge of TCK.

– Pins M0, M1 and M2: These 3 pins are used to force the test modes.

Depending on the device selected, these 8 pins will be associated with different pin num-

bers (see APPENDIX 1).

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