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AN3269 数据表(PDF) 9 Page - STMicroelectronics

部件名 AN3269
功能描述  This application note introduces some
PDF  19 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

AN3269 数据表(HTML) 9 Page - STMicroelectronics

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AN3269
Application description
Doc ID 17904 Rev 1
9/19
1.5.2
Bias current record
This operation consists of storing in memory the value of the bias current inherent to
operational amplifier A (see Figure 2) of your STM8L-DISCOVERY. The bias current value is
taken into account for low power measurements in order to minimize measurement errors.
Once recorded, this value does not need to be refreshed and is kept in non-volatile memory
for future use. It is recommended to perform this operation when you start your evaluation in
order to obtain the best precision.
This mode is only accessible at application power-up by executing the following actions in
the order below:
Switch OFF STM8L-DISCOVERY
Place JP1 in OFF position (IDD measurement disabled)
Maintain USER push-button pressed while switching ON the STM8L-DISCOVERY
At power on, a scrolling message “Bias Current” is displayed
Release the USER push-button; the bias current value is displayed and immediately
stored in non-volatile memory
Once this operation completed, replace JP1 in ON position so that the measurement
circuitry connects again to STM8L152 (IDD measurement enabled).
1.5.3
Manufacturing test
You can access this mode while Demo mode is running, by pressing the USER push-button
for more than 3 seconds and by releasing it. This allows you to verify that the hardware
modules needed by the STM8L-DISCOVERY for this example are working properly.
In this mode, application checks the LSE oscillator (Low Speed External), VDD voltage
value, IDD RUN, IDD HALT and LP (low power) IDD currents. The currents are tested with
lower and upper limits. For each test function, the application displays “OK” and the
measured values when available. If all checks are successfully completed, then the
message “TEST OK” is continuously displayed. If one of the tests fails, then the application
alerts the user by continuously displaying the test name followed by “NO OK”.
To exit this manufacturing test, press the RESET button.
Note:
Generally, if the manufacturing test is not successful, first check that JP1 is placed in the ON
position and that solder bridges SB11 to SB17 are shorted. If errors are found in the Low
power and Halt modes IDD measurements, the bias current record operation should be
performed again.
1.6
Low power modes
The low power modes used in this application example are:
Low power run mode (with or without LCD): In this mode the CPU and some of the
peripherals are running. As selected, the LCD can be used or not. In the latter case, the
LCD and the RTC clock are disabled to save power and GPIOs are placed in output
push-pull configuration to limit consumption. During Low power run mode, the code is
executed from RAM and CPU is clocked by the LSI oscillator. Flash and data EEPROM
are stopped and the voltage regulator is configured in Ultra low power mode. The



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