4

RH1014M

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group B and D for Class S, and

1,2,3

Group C and D for Class B

End Point Electrical Parameters (Method 5005)

* PDA applies to subgroup 1. See PDA Test Notes.

TABLE 2: ELECTRICAL TEST REQUIRE E TS

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after

burn-in divided by the total number of devices submitted for burn-in in

that lot shall be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.

TOTAL DOSE BIAS CIRCUIT

Negative Slew Rate

Positive Slew Rate

CC

HARA TERISTICS

A

TYPICALPERFOR

CE

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G03

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G02

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G01

Supply Current (Per Amplifier)

15V

–15V

10k

8V

RH1014M TDBC

+

–

10k