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PIC16C58B-20/SS 数据表(PDF) 28 Page - Microchip Technology |
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PIC16C58B-20/SS 数据表(HTML) 28 Page - Microchip Technology |
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28 / 84 page ![]() PIC16CR54C DS40191A-page 28 Preliminary © 1998 Microchip Technology Inc. The Electrical Specifications sections show RC frequency variation from part to part due to normal process variation. The variation is larger for larger R (since leakage current variation will affect RC frequency more for large R) and for smaller C (since variation of input capacitance will affect RC frequency more). Also, see the Electrical Specifications sections for variation of oscillator frequency due to VDD for given Rext/Cext values as well as frequency variation due to operating temperature for given R, C, and VDD values. The oscillator frequency, divided by 4, is available on the OSC2/CLKOUT pin, and can be used for test purposes or to synchronize other logic. FIGURE 7-6: RC OSCILLATOR MODE Note: If you change from this device to another device, please verify oscillator characteristics in your application. VDD Rext Cext VSS OSC1 Internal clock OSC2/CLKOUT Fosc/4 PIC16CR54C N 7.3 Reset PIC16CR54C devices may be reset in one of the following ways: • Power-On Reset (POR) • MCLR reset (normal operation) • MCLR wake-up reset (from SLEEP) • WDT reset (normal operation) • WDT wake-up reset (from SLEEP) Table 7-3 shows these reset conditions for the PCL and STATUS registers. Some registers are not affected in any reset condition. Their status is unknown on POR and unchanged in any other reset. Most other registers are reset to a “reset state” on Power-On Reset (POR), MCLR or WDT reset. A MCLR or WDT wake-up from SLEEP also results in a device reset, and not a continuation of operation before SLEEP. The TO and PD bits (STATUS <4:3>) are set or cleared depending on the different reset conditions (Section 7.7). These bits may be used to determine the nature of the reset. Table 7-4 lists a full description of reset states of all registers. Figure 7-7 shows a simplified block diagram of the on-chip reset circuit. |
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