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PIC16LC710-10/P 数据表(PDF) 44 Page - Microchip Technology |
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PIC16LC710-10/P 数据表(HTML) 44 Page - Microchip Technology |
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44 / 176 page ![]() PIC16C71X DS30272A-page 44 © 1997 Microchip Technology Inc. 7.5 A/D Operation During Sleep The A/D module can operate during SLEEP mode. This requires that the A/D clock source be set to RC (ADCS1:ADCS0 = 11). When the RC clock source is selected, the A/D module waits one instruction cycle before starting the conversion. This allows the SLEEP instruction to be executed, which eliminates all digital switching noise from the conversion. When the conver- sion is completed the GO/DONE bit will be cleared, and the result loaded into the ADRES register. If the A/D interrupt is enabled, the device will wake-up from SLEEP. If the A/D interrupt is not enabled, the A/D mod- ule will then be turned off, although the ADON bit will remain set. When the A/D clock source is another clock option (not RC), a SLEEP instruction will cause the present conver- sion to be aborted and the A/D module to be turned off, though the ADON bit will remain set. Turning off the A/D places the A/D module in its lowest current consumption state. 7.6 A/D Accuracy/Error The absolute accuracy specified for the A/D converter includes the sum of all contributions for quantization error, integral error, differential error, full scale error, off- set error, and monotonicity. It is defined as the maxi- mum deviation from an actual transition versus an ideal transition for any code. The absolute error of the A/D converter is specified at < ±1 LSb for VDD = VREF (over the device’s specified operating range). However, the accuracy of the A/D converter will degrade as VDD diverges from VREF. For a given range of analog inputs, the output digital code will be the same. This is due to the quantization of the analog input to a digital code. Quantization error is typically ± 1/2 LSb and is inherent in the analog to dig- ital conversion process. The only way to reduce quanti- zation error is to increase the resolution of the A/D converter. Offset error measures the first actual transition of a code versus the first ideal transition of a code. Offset error shifts the entire transfer function. Offset error can be calibrated out of a system or introduced into a sys- tem through the interaction of the total leakage current and source impedance at the analog input. Gain error measures the maximum deviation of the last actual transition and the last ideal transition adjusted for offset error. This error appears as a change in slope of the transfer function. The difference in gain error to Note: For the A/D module to operate in SLEEP, the A/D clock source must be set to RC (ADCS1:ADCS0 = 11). To perform an A/D conversion in SLEEP, ensure the SLEEP instruction immediately follows the instruc- tion that sets the GO/DONE bit. full scale error is that full scale does not take offset error into account. Gain error can be calibrated out in soft- ware. Linearity error refers to the uniformity of the code changes. Linearity errors cannot be calibrated out of the system. Integral non-linearity error measures the actual code transition versus the ideal code transition adjusted by the gain error for each code. Differential non-linearity measures the maximum actual code width versus the ideal code width. This measure is unadjusted. In systems where the device frequency is low, use of the A/D RC clock is preferred. At moderate to high fre- quencies, TAD should be derived from the device oscil- lator. TAD must not violate the minimum and should be ≤ 8 µs for preferred operation. This is because TAD, when derived from TOSC, is kept away from on-chip phase clock transitions. This reduces, to a large extent, the effects of digital switching noise. This is not possible with the RC derived clock. The loss of accuracy due to digital switching noise can be significant if many I/O pins are active. In systems where the device will enter SLEEP mode after the start of the A/D conversion, the RC clock source selection is required. In this mode, the digital noise from the modules in SLEEP are stopped. This method gives high accuracy. 7.7 Effects of a RESET A device reset forces all registers to their reset state. This forces the A/D module to be turned off, and any conversion is aborted. The value that is in the ADRES register is not modified for a Power-on Reset. The ADRES register will contain unknown data after a Power-on Reset. 7.8 Connection Considerations If the input voltage exceeds the rail values (VSS or VDD) by greater than 0.2V, then the accuracy of the conver- sion is out of specification. An external RC filter is sometimes added for anti-alias- ing of the input signal. The R component should be selected to ensure that the total source impedance is kept under the 10 k Ω recommended specification. Any external components connected (via hi-impedance) to an analog input pin (capacitor, zener diode, etc.) should have very little leakage current at the pin. Note: Care must be taken when using the RA0 pin in A/D conversions due to its proximity to the OSC1 pin. |
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