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UTM6006G-S08-R 数据表(PDF) 3 Page - Unisonic Technologies |
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UTM6006G-S08-R 数据表(HTML) 3 Page - Unisonic Technologies |
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3 / 7 page ![]() UTM6006 Power MOSFET UNISONICTECHNOLOGIESCO.,LTD 3 of 7 www.unisonic.com.tw QW-R502-B18.D ELECTRICAL CHARACTERISTICS (TJ=25°C, unless otherwise noted) PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT OFF CHARACTERISTICS Drain-Source Breakdown Voltage BVDSS ID=250µA, VGS=0V 60 V BVDSS Temperature Coefficient △ BVDSS △ /TJ Reference to 25°C , ID=1mA 0.057 V/°C VDS=48V, VGS=0V, TJ=25°C 1 µA Drain-Source Leakage Current IDSS VDS=48V, VGS=0V, TJ=55°C 5 µA Forward VGS=+20V, VDS=0V +100 nA Gate-Source Leakage Current Reverse IGSS VGS=-20V, VDS=0V -100 nA ON CHARACTERISTICS Gate Threshold Voltage VGS(TH) 1.2 2.5 V VGS(TH) Temperature Coefficient △ VGS(TH) VDS=VGS, ID=250µA -5.68 mV/° C VGS=10V, ID=6A 14 18 mΩ Static Drain-Source On-State Resistance (Note 2) RDS(ON) VGS=4.5V, ID=4A 16 20 mΩ Forward Transconductance gFS VDS=5V, ID=6A 40 S DYNAMIC PARAMETERS Input Capacitance CISS 1070 1200 pF Output Capacitance COSS 200 220 pF Reverse Transfer Capacitance CRSS VGS=0V, VDS=25V, f=1.0MHz 190 210 pF SWITCHING PARAMETERS (Note 2) Total Gate Charge (4.5V) QG 290 310 nC Gate to Source Charge QGS 10.7 15 nC Gate to Drain Charge QGD VGS=10V, VDS=48V, ID=1A 30 45 nC Turn-ON Delay Time tD(ON) 55 70 ns Rise Time tR 100 120 ns Turn-OFF Delay Time tD(OFF) 580 620 ns Fall-Time tF VGS=10V, VDD=30V, RG=3.3Ω, ID=2A 190 210 ns GUARANTEED AVALANCHE CHARACTERISTICS Single Pulse Avalanche Energy (Note 5) EAS VDD=25V, L=0.1mH, IAS=15A 19 mJ DIODE CHARACTERISTICS Continuous Source Current (Note 1, 6) IS 6.3 A Pulsed Source Current (Note 2, 6) ISM VG=VD=0V , Force Current 32 A Diode Forward Voltage (Note 2) VSD VGS=0V , IS=6.3A , TJ=25°C 1 V Reverse Recovery Time trr 15 nS Reverse Recovery Charge Qrr IF=6A, dI/dt=100A/μs, TJ=25°C 10.4 nC Notes: 1. The data tested by surface mounted on a 1 inch 2 FR-4 board with 2OZ copper. 2. The data tested by pulsed, pulse width≤300µs, duty cycle≤2%. 3. The EAS data shows Max. rating. The test condition is VDD=25V, VGS=10V, L=0.1mH, IAS=30A. 4. The power dissipation is limited by 150°C junction temperature. 5. The Min. value is 100% EAS tested guarantee. 6. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation. |
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