PK PACKAGE

(TOP VIEW)

INPUT

COMMON

OUTPUT

LP PACKAGE

(TO-92, TO-226AA)

(TOP VIEW)

INPUT

COMMON

OUTPUT

D PACKAGE

(TOP VIEW)

1

2

3

4

8

7

6

5

OUTPUT

COMMON

COMMON

NC

INPUT

COMMON

COMMON

NC

NC – No internal connection

μA78L00

www.ti.com

SLVS010U – JANUARY 1976 – REVISED MAY 2011

μA78L00 Series Positive-Voltage Regulators

Check for Samples:

μA78L00

1

FEATURES

DESCRIPTION

This series of fixed-voltage integrated-circuit voltage

•

3-Terminal Regulators

regulators

is

designed

for

a

wide

range

of

•

Output Current up to 100 mA

applications.

These

applications

include

on-card

•

No External Components

regulation for elimination of noise and distribution

problems associated with single-point regulation. In

•

Internal Thermal-Overload Protection

addition, they can be used with power-pass elements

•

Internal Short-Circuit Current Limiting

to make high-current voltage regulators. One of these

regulators can deliver up to 100 mA of output current.

The internal limiting and thermal-shutdown features of

these regulators essentially make them immune to

overload. When used as a replacement for a Zener

diode-resistor combination, an effective improvement

in output impedance can be obtained, together with

lower bias current.

The

μA78L00C and μA78L00AC series devices are

characterized for operation over the virtual junction

temperature range of 0°C to 125°C. The

μA78L05AI

device is characterized for operation over the virtual

junction temperature range of

−40°C to 125°C.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 1976–2011, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.