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100370 数据表(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 100370
功能描述  Low Power Universal Demultiplexer/Decoder
PDF  8 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

100370 数据表(HTML) 5 Page - National Semiconductor (TI)

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AC Electrical Characteristics
V
EE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
T
C = −55˚C
T
C = +25˚C
T
C = +125˚C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
PLH
Propagation Delay
0.3
2.40
0.4
2.20
0.40
2.70
ns
t
PHL
E
na,Enb to Output
t
PLH
Propagation Delay
0.30
2.60
0.40
2.40
0.40
2.90
ns
t
PHL
A
na,Anb to Output
(Notes 9, 10,
11)
t
PLH
Propagation Delay
0.30
2.60
0.40
2.40
0.40
2.40
ns
Figures 1, 2
t
PHL
H
a,Hb,Hc to Output
t
PLH
Propagation Delay
0.40
3.10
0.60
2.80
0.70
3.70
ns
t
PHL
M to Output
t
TLH
Transition Time
0.30
1.60
0.30
1.60
0.30
1.60
ns
(Note 12)
t
THL
20% to 80%,80% to 20%
Note 9: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 10: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9.
Note 11: Sample tested (Method 5005, Table I) on each Mfg. lot at +25˚C, Subgroup A9, and at +125˚C, and −55˚C Temp., Subgroups A10 and A11.
Note 12: Not tested at +25˚C, +125˚C and −55˚C Temperature (design characterization data).
Test Circuit
DS100311-7
Notes:
VCC,VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50
Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50
Ω to GND
CL = Fixture and stray capacitance ≤ 3pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
www.national.com
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