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WLCSP 数据表(PDF) 2 Page - Amkor Technology

部件名 WLCSP
功能描述  Wafer Level Processing and Die Processing Services
PDF  2 Pages
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制造商  AMKOR [Amkor Technology]
网页  http://www.amkor.com
标志 AMKOR - Amkor Technology

WLCSP 数据表(HTML) 2 Page - Amkor Technology

  WLCSP Datasheet HTML 1Page - Amkor Technology WLCSP Datasheet HTML 2Page - Amkor Technology  
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WAFER LEVEL PACKAGING
Data Sheet
Questions? Contact us: marketing@amkor.com
With respect to the information in this document, Amkor makes no guarantee or warranty of its accuracy or that the use of such information will not infringe upon the intellectual rights of third parties. Amkor shall not
be responsible for any loss or damage of whatever nature resulting from the use of, or reliance upon it and no patent or other license is implied hereby. This document does not in any way extend or modify Amkor’s
warranty on any product beyond that set forth in its standard terms and conditions of sale. Amkor reserves the right to make changes in its product and specifications at any time and without notice. The Amkor name
and logo are registered trademarks of Amkor Technology, Inc. All other trademarks mentioned are property of their respective companies. © 2016, Amkor Technology Incorporated. All Rights Reserved.
Visit Amkor Technology online for locations and
to view the most current product information.
DS720H
Rev Date: 1/16
Package Options
Ball Loading
Pitch
Sphere Diameter
0.50 mm
0.30 mm
0.40 mm
0.25 mm
0.30 mm
0.20 mm
Reliability Qualification
Package Level:
• Preconditioning at Level 1 85°C/85% RH, 168 hours,
(Unlimited out of bag life)
reflow @ 260°C peak
• Temp Cycle
-55°C/+125°C, 1000 cycles
• High Temp Storage
150°C, 1000 hours
Board Level:
• Temp Cycle 
-40°C/+125°C, 15 min. ramp rate, ≥ 500 cycles
• Drop Test 
JEDEC condition B (1500G), ≥ 100 drops
WLPTest
DPS
• Design services available
– Layout
– Mask tooling
• Wafer RDL patterning and
bumping (ball sphere loaded
or plated)
• Automated Optical Inspection
(AOI) for best in class quality
assurance
• Wafer map generation
• Test software and hardware
development
• Probe card design, service
and support
• Test program transfer
• Wafer sort for RF, memory,
logic and analog applications
• Best in class singulated device
edge quality for all Si nodes
• Shipping material design and
supply management
• Drop ship to final customer
available
Contact Probe
Inspect & Clean
PBO or PI 1
RDL Seed Deposition
Resist Processing
Cu RDL Plating
Resist & Seed Removal
PBO or PI 2
UBM Seed Deposition
Resist Processing
Cu or Ni-based UBM
Resist & Seed Removal
Ball Place
Backgrind
Backside Lamination
Laser Mark
Singulation
Tape & Reel
AOI
Process Highlights
• Die thickness
150 µm* to 450 µm
• Bump height
0.5 mm Pitch: 250 µm
0.4 mm Pitch: 210 µm
0.3 mm Pitch: 170 µm
• Solder ball pitch (ball loaded)
0.28, 0.3, 0.35, 0.4, 0.5 mm
Pitch (plated)
0.12 to 0.25 mm
• Solder sphere diameter
0.2, 0.25, 0.3 mm
• Redistribution trace/space (min)
CSPnl: 12/12 µm
CSPn3: 15/15 µm
• Via diameter (min)
PBO: 15 µm
Polyimide: 25 µm
• Backside laminate (black)
Available
• Saw street (min)
65 µm (passivation free space)
Standard Materials
• Dielectric materials
PBO and polyimide,
cure polymers, low cure polymers
• RDL metalization
Plated copper
• UBM
Thick Cu or Ni-based
• Solder composition (ball loaded)
Pb-free SAC alloys
(plated)
Sn/Ag Pb-free, Cu pillar
Shipping
Carrier tape
7″, 13″ reels
*Advanced manufacturing rules may be required. Contact Amkor Business Unit
for additional information.
Capabilities and Services
WLCSP



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