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WLCSP 数据表(PDF) 2 Page - Amkor Technology |
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WLCSP 数据表(HTML) 2 Page - Amkor Technology |
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2 / 2 page ![]() WAFER LEVEL PACKAGING Data Sheet Questions? Contact us: marketing@amkor.com With respect to the information in this document, Amkor makes no guarantee or warranty of its accuracy or that the use of such information will not infringe upon the intellectual rights of third parties. Amkor shall not be responsible for any loss or damage of whatever nature resulting from the use of, or reliance upon it and no patent or other license is implied hereby. This document does not in any way extend or modify Amkor’s warranty on any product beyond that set forth in its standard terms and conditions of sale. Amkor reserves the right to make changes in its product and specifications at any time and without notice. The Amkor name and logo are registered trademarks of Amkor Technology, Inc. All other trademarks mentioned are property of their respective companies. © 2016, Amkor Technology Incorporated. All Rights Reserved. Visit Amkor Technology online for locations and to view the most current product information. DS720H Rev Date: 1/16 Package Options Ball Loading Pitch Sphere Diameter 0.50 mm 0.30 mm 0.40 mm 0.25 mm 0.30 mm 0.20 mm Reliability Qualification Package Level: • Preconditioning at Level 1 85°C/85% RH, 168 hours, (Unlimited out of bag life) reflow @ 260°C peak • Temp Cycle -55°C/+125°C, 1000 cycles • High Temp Storage 150°C, 1000 hours Board Level: • Temp Cycle -40°C/+125°C, 15 min. ramp rate, ≥ 500 cycles • Drop Test JEDEC condition B (1500G), ≥ 100 drops WLPTest DPS • Design services available – Layout – Mask tooling • Wafer RDL patterning and bumping (ball sphere loaded or plated) • Automated Optical Inspection (AOI) for best in class quality assurance • Wafer map generation • Test software and hardware development • Probe card design, service and support • Test program transfer • Wafer sort for RF, memory, logic and analog applications • Best in class singulated device edge quality for all Si nodes • Shipping material design and supply management • Drop ship to final customer available Contact Probe Inspect & Clean PBO or PI 1 RDL Seed Deposition Resist Processing Cu RDL Plating Resist & Seed Removal PBO or PI 2 UBM Seed Deposition Resist Processing Cu or Ni-based UBM Resist & Seed Removal Ball Place Backgrind Backside Lamination Laser Mark Singulation Tape & Reel AOI Process Highlights • Die thickness 150 µm* to 450 µm • Bump height 0.5 mm Pitch: 250 µm 0.4 mm Pitch: 210 µm 0.3 mm Pitch: 170 µm • Solder ball pitch (ball loaded) 0.28, 0.3, 0.35, 0.4, 0.5 mm Pitch (plated) 0.12 to 0.25 mm • Solder sphere diameter 0.2, 0.25, 0.3 mm • Redistribution trace/space (min) CSPnl: 12/12 µm CSPn3: 15/15 µm • Via diameter (min) PBO: 15 µm Polyimide: 25 µm • Backside laminate (black) Available • Saw street (min) 65 µm (passivation free space) Standard Materials • Dielectric materials PBO and polyimide, cure polymers, low cure polymers • RDL metalization Plated copper • UBM Thick Cu or Ni-based • Solder composition (ball loaded) Pb-free SAC alloys (plated) Sn/Ag Pb-free, Cu pillar Shipping Carrier tape 7″, 13″ reels *Advanced manufacturing rules may be required. Contact Amkor Business Unit for additional information. Capabilities and Services WLCSP |
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