LMP7300MM datasheet(6/30 Pages) TI1

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LMP7300

SNOSAT7G – AUGUST 2007 – REVISED OCTOBER 2015

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6.6 Electrical Characteristics: 5-V

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 5 V, V− = 0 V, and V

CM = V

+/2, R

PULLUP = 100 kΩ,

CLOAD = 10 pF.

(1)

PARAMETER

TEST CONDITIONS

MIN(2)

TYP(3)

MAX(2)

UNIT

TA = 25°C

Supply Current

RPULLUP = Open

μA

TJ = TA

COMPARATOR

TA = 25°C

±0.07

±0.75

VCM = V

+/2

SOIC

TJ = TA

±2

VOS

Input Offset Voltage

TA = 25°C

±0.07

±1

VCM = V

+/2

VSSOP

TJ = TA

±2.2

TCVOS

Input Offset Average Drift

See(4)

1.8

μV/°C

TA = 25°C

1.2

Input Bias Current(5)

|VID| < 2.5 V

TJ = TA

IOS

Input Offset Current

0.15

0.5

Common Mode Rejection

CMRR

≤ VCM ≤ 5 V

100

Ratio

Power Supply Rejection

PSRR

V+ = 2.7 V to 12 V

100

Ratio

VOL

Output Voltage Low

ILOAD = 10 mA

0.25

0.4

ILEAK

Output Leakage Current

Comparator Output in High State

0 < Ref-VHYSTP,N < 25 mV

Hysteresis Control Voltage

HCLIN

mV/V

Linearity

25 mV < Ref-VHYSTP,N < 100 mV

0.950

TA = 25°C

1.2

Hysteresis Leakage

IHYS

Current

TJ = TA

Overdrive = 10 mV, CL = 10 pF

Propagation Delay

TPD

μs

(High to Low)

Overdrive = 100 mV, CL = 10 pF

REFERENCE

SOIC

2.043

2.048

2.053

Reference Voltage

VSSOP

2.043

2.048

2.056

Line Regulation

VCC = 2.7 V to 12 V

μV/V

Load Regulation

IOUT = 0 to 1 mA

0.2

0.5

mV/mA

TCVREF/°

Temperature Coefficient

−40°C to 125°C

ppm/°C

0.1 Hz to 10 Hz

μVPP

Output Noise Voltage

10 Hz to 10 kHz

100

μVRMS

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage average drift determined by dividing the change in VOS at temperature extremes, by the total temperature change.

(5)

Positive current corresponds to current flowing into the device.

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