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AS5047P 数据表(PDF) 29 Page - ams AG |
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AS5047P 数据表(HTML) 29 Page - ams AG |
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29 / 40 page ![]() ams Datasheet Page 29 [v1-00] 2014-Oct-31 Document Feedback AS5047P − Application Information 15. Read reg(0x0016) to reg(0x0019) → Read register step2 16. Comparison of written content (settings and angle) with content of read register step2. Mandatory: guard band test (Removing of Bit0 of Settings1 from the comparison is mandatory. Bit0 is preprogrammed) 17. New power ON cycle, if point 16 is correct. If point 16 fails, the test with the guard band test1 was not successful and the device is incorrectly programmed. A reprogramming is not allowed! 18. Read reg(0x0016) to reg(0x0019) → Read register step3 19. Comparision of written content (settings and angle) with content of read register step3(Removing of Bit0 of Settings1 from the comparison is mandatory. Bit0 is preprogrammed). 20. If point 19 is correct, the programming was successful. If point 19 fails, device is incorrectly programmed. A reprogramming is not allowed 1. Guard band test: - Restricted to temperature range: 25 °C ± 20 °C - Right after the programming procedure (max. 1 hour with same - Conditions 25°C ± 20 °C) - Same VDD voltage The guard band test is only for the verification of the burned OTP fuses during the programming sequence. A use of the guard band in other cases is not allowed. |
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