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ADP1055ACPZ-R7 数据表(PDF) 8 Page - Analog Devices |
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ADP1055ACPZ-R7 数据表(HTML) 8 Page - Analog Devices |
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8 / 140 page  ADP1055 Data Sheet Rev. A | Page 8 of 140 Parameter Symbol Test Conditions/Comments Min Typ Max Unit Measurement Accuracy for External Temperature Sensor With BC847A transistor (nf = 1.00); Register 0xFE5A[2:0] = 0x04 Forward Temperature Sensor Error from −40°C to +25°C −11.7 +13.4 °C Error from 25°C to 125°C −8.9 +14.7 °C Reverse Temperature Sensor Error from 25°C to 125°C −9.7 +14.4 °C CTRL, SMBALRT, SYNC, GPIO1 TO GPIO4, ISHARE PINS Digital inputs/outputs Input Low Voltage VIL 0.8 V Input High Voltage VIH VDD − 0.8 V Propagation Delay 40 ns GPIOx Rise Time GPIOx configured as an output 3.5 ns GPIOx Fall Time GPIOx configured as an output 1.5 ns Leakage Current SMBALRT, SYNC, GPIO1 TO GPIO4, and ISHARE pins 1.0 μA CTRL pin 10.0 μA SYNC PIN Synchronization to external frequency 50 1000 kHz Minimum On Pulse 40 ns Synchronization Range2 −10.0 +10.0 % fSW Leakage Current 1.0 μA BLACK BOX PROGRAMMING TIME 1.2 36 × 1.2 ms SDA/SCL PINS Input Low Voltage VIL 0.8 V Input High Voltage VIH 2.1 V Output Low Voltage VOL 0.4 V Leakage Current 1.0 μA SERIAL BUS TIMING See Figure 3 Clock Operating Frequency 10 100 400 kHz Bus Free Time tBUF Between stop and start conditions 1.3 μs Start Hold Time tHD;STA Hold time after (repeated) start condition; after this period, the first clock is generated 0.6 μs Start Setup Time tSU;STA Repeated start condition setup time 0.6 μs Stop Setup Time tSU;STO 0.6 μs SDA Setup Time tSU;DAT 100 ns SDA Hold Time tHD;DAT For write and for readback 300 ns SCL Low Timeout tTIMEOUT 25 35 ms SCL Low Period tLOW 1.3 μs SCL High Period tHIGH 0.6 μs Clock Low Extend Time tLO;SEXT 25 ms SCL, SDA Fall Time tF 20 300 ns SCL, SDA Rise Time tR 20 300 ns EEPROM RELIABILITY Endurance3 TJ = 85°C 10,000 Cycles TJ = 125°C 1000 Cycles Data Retention4 TJ = 85°C 20 Years TJ = 125°C 15 Years 1 Differential voltage from CS2+ to CS2−. 2 fSW is the switching frequency set in Register 0x33. 3 Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. 4 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22, Method A117. Retention lifetime derates with junction temperature. |
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