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STGIF5CH60TS-E 数据表(PDF) 11 Page - STMicroelectronics |
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STGIF5CH60TS-E 数据表(HTML) 11 Page - STMicroelectronics |
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11 / 22 page ![]() DocID026577 Rev 2 11/22 STGIF5CH60TS-E Fault management 22 4 Fault management The device integrates an open-drain output connected to SD Pin. As soon as a fault occurs the open-drain is activated and LVGx outputs are forced low. Two types of fault can be pointed out: • Overcurrent (OC) sensed by the internal comparator (see more detail in Section 4.2: Smart shutdown function); • Undervoltage on supply voltage (VCC); Each fault enables the SD open drain for a different time; refer to the following Table 10: Fault timing. Actually the device remains in a fault condition (SD at low logic level and LVGx outputs disabled) for a time also depending on RC network connected to SD pin. The network generate a time contribute that add up to the internal value. Figure 4. Overcurrent timing (without contribution of RC network on SD) Table 10. Fault timing Symbol Parameter Event time SD open-drain enable time result OC Over-current event ≤ 20 μs 20 μs ≥ 20µs OC time UVLO Under-voltage lock out event ≤ 50 μs50µs ≥ 50µs until the VCC_LS exceed the VCC_LS UV turn ON threshold UVLO time |
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