VNH7070AS datasheet(12/38 Pages) STMICROELECTRONICS

12 / 38 page

Electrical specifications

VNH7070AS

12/38

DocID028088 Rev 3

tD_VOL

OFF-state diagnostic

delay time from rising

edge of VOUT (see

Figure 11)

INA =INB = 0 V; PWM = 0;

VOUTx = 0 V to 4 V;

VSEL0 = 5 V for CHA;

VSEL0 = 0 V and within

td_stby for CHB

530

µs

tLATCH_RST_HS

(1)

Input reset time for high

side fault unlatch (see

Figure 9)

VINx = 5 V to 0 V; HSDx

faulting

310

µs

tLATCH_RST_LS

(1)

Input reset time for low

side fault unlatch (see

Figure 10)

VINx = 0 V to 5 V; LSDx

faulting

310

µs

Parameter guaranteed by design and characterization; not subjected to production test.

Table 10. CS (7 V < VCC <18 V)

Symbol

Parameter

Test conditions

Min.

Typ.

Max.

Unit

VSENSE_CL

Multisense clamp

voltage

VCC =18 V; ISENSE =-5mA

VCC =18 V; ISENSE =5 mA

-13

-9

IOUT/ISENSE

IOUT = 0.05 A; VSENSE = 0.5 V;

Tj = -40°C to 150°C

665

IOUT/ISENSE

IOUT = 0.2 A; VSENSE = 0.5 V;

Tj = -40°C to 150°C

1083

1900

2716

IOUT/ISENSE

IOUT = 3.5 A; VSENSE = 4 V;

Tj = -40°C to 150°C

1315

1540

1779

IOUT/ISENSE

IOUT = 5.5 A; VSENSE = 4 V;

Tj = -40°C to 150°C

1357

1540

1727

dK0/K0

(1)(2)

Analog sense current

drift

IOUT = 0.05 A; VSENSE = 0.5 V;

Tj = -40°C to 150°C

-25

dK1/K1

(1)(2)

Analog sense current

drift

IOUT = 0.2 A; VSENSE = 0.5 V;

Tj = -40°C to 150°C

-21

dK2/K2

(1)(2)

Analog sense current

drift

IOUT = 3.5 A; VSENSE =4 V;

Tj = -40°C to 150°C

-5

dK3/K3

(1)(2)

Analog sense current

drift

IOUT = 5.5 A; VSENSE = 4 V;

Tj = -40°C to 150°C

-4

VSENSESAT

Max analog sense

output voltage

VCC = 7; RSENSE = 10 kΩ;

VSEL0 =5 V; IOUTA = 5.5 A;

VINA = 5 V; PWM = 0;

Tj =150°C

ISENSE_SAT

CurrentSense

saturation current

VCC =13 V; VINA =5 V;

VINB =0 V; VSENSE =4 V;

VSEL0 =5 V; Tj = 150°C

4.6

IOUT_SAT

(2)

Output saturation

current

VCC =13 V; VSENSE =4 V;

VINA =5 V; VINB = 0 V;

VSEL0 =5 V; Tj =150°C

Table 9. Protections and diagnostics (VCC =7 V up to 18 V; -40 °C < Tj <150 °C)

Symbol

Parameter

Test conditions

Min. Typ. Max. Unit

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