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TLE4925 数据表(PDF) 24 Page - Infineon Technologies AG |
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TLE4925 数据表(HTML) 24 Page - Infineon Technologies AG |
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24 / 25 page ![]() PRELIMINARY Page 24 of 25 Noise 1 σ Bdiff_typ Bdiff_max 3 σ B ϕ ϕ ∂ ∂B Phase-Jitter Figure17: Phase-Jitter Stochastic Phase Error ∆ϕ The stochastic phase error includes the error due to the variation of the delay time with temperature and the error caused by the resolution of the threshold. It can be calculated in the following way: d d t n ∆ • • ° = ∆ 60 360 ϕ ∆ϕ d ... stochastic phase error due to the variation of the delay time over temperature in ° n … speed of the camshaft wheel in min -1 ∆t d … variation of delay time over temperature in sec Jitter (Repeatability) The phase jitter is normally caused by the analogue system noise. If there is an update of the offset-DAC due to the algorithm, what could happen after each tooth, then an additional step in the phase occurs (see description of the algorithm). This is not included in the following calculations. The noise is transformed through the slope of the magnetic edge into a phase error. The phase jitter is determined by the two formulas: ( ) typ neff typ Jitter B B _ _ • ∂ ∂ = ϕ ϕ ( ) max _ max _ neff Jitter B B • ∂ ∂ = ϕ ϕ |
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