If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Storage Temperature

−65˚C to +150˚C

Ambient Temperature under Bias

−55˚C to +125˚C

Junction Temperature under Bias

Ceramic

−55˚C to +175˚C

V

Ground Pin

−0.5V to +7.0V

Input Voltage (Note 1)

−0.5V to +7.0V

Input Current (Note 1)

−30 mA to +5.0 mA

Voltage Applied to Any Output

in the Disabled or

Power-Off State

−0.5V to +5.5V

in the HIGH State

−0.5V to V

CC

Current Applied to Output

in LOW State (Max)

Twice the rated I

DC Latchup Source Current

−500 mA

Recommended Operating

Conditions

Free Air Ambient Temperature

Military

−55˚C to +125˚C

Supply Voltage

Military

+4.5V to +5.5V

Minimum Input Edge Rate

(

∆V/∆t)

Data Input

50 mV/ns

Enable Input

20 mV/ns

Note 1: Absolute maximum ratings are those values beyond which damage

to the device may occur. The databook specifications should be met, without

exception, to ensure that the system design is reliable over its power supply,

temperature, and output/input loading variables. National does not recom-

DC Characteristics for ’FCT Family Devices

Symbol

Parameter

FCT138

Units

V

CC

Conditions

Min

Max

V

IH

Input HIGH Voltage

2.0

V

Recognized HIGH Signal

V

IL

Input LOW Voltage

0.8

V

Recognized LOW Signal

V

CD

Input Clamp Diode Voltage

−1.2

V

Min

I

V

OH

Output HIGH

Voltage

54FCT

4.3

V

Min

I

54FCT

2.4

I

V

OL

Output LOW

Voltage

54FCT

0.2

V

Min

I

54FCT

0.5

I

I

IH

Input HIGH Current

5

µA

Max

V

I

IL

Input LOW Current

−5

µA

Max

V

I

OS

Output Short-Circuit Current

-60

mA

Max

V

I

CCQ

Quiescent Power Supply Current

1.5

mA

Max

V

5.5V

∆I

CC

Quiescent Power

Supply Current

2.0

mA

Max

V

I

CCD

Dynamic I

CC

0.4

mA/

MHz

Max

Outputs Open, V

5.3V or V

Toggling, 50% Duty Cycle, OE =

GND, LE = V

CC

I

CCT

Total Power Supply

Current

5.5

mA

Max

Outputs Open, f

V

0.2V, One Bit Toggling, 50%

Duty Cycle, OE = GND, LE =

V

CC

Note 2: All outputs loaded; thresholds on input associated with output under test.

Note 3: Maximum test duration 2.0 ms, one output loaded at a time.

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