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PCS5035 数据表(PDF) 3 Page - Aeroflex Circuit Technology |
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PCS5035 数据表(HTML) 3 Page - Aeroflex Circuit Technology |
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3 / 9 page ![]() 3 SCD5035 Rev J 10/22/2014 Aeroflex Plainview ABSOLUTE MAXIMUM RATINGS Parameter Range Units Operating Case Temperature -55 to +125 °C Storage Case Temperature -65 to +150 °C Power Supply Voltages (VCC)+7.0 V NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress rating only; functional operation beyond the "Operation Conditions" is not recommended and extended exposure beyond the "Operation Conditions" may affect device reliability. ELECTRICAL PERFORMANCE CHARACTERISTICS (TC = -55°C TO +125°C, +VCC = +5.0VDC ±5% -- UNLESS OTHERWISE SPECIFIED ) Parameter Symbol Condition Min Max Unit Source Current 1-5 1/ IO 0 VIN 3.1V, VEN = VENH 77 83 µA IOFF 0 VIN 3.1V, VEN = VENL -150 nA Comparator In Voltage VIN IOUT = 80µA 0 3.1 V Comparator Ref In Voltage 2/VREF -3.1 V Comparator Ref In Current IREF - 1200 nA Enable Input Voltage Low VENL -0.8 V Enable Input Voltage High VENH 2.4 - V Comparator Hysteresis 2/- - 30 mV Output Voltage Low 1-5 1/VOL ISINK 2.0mA - 0.4 V Output Voltage High 1-5 1/VOH 4.4 - V Input Open Circuit Voltage VINOC 4.0 4.6 V Band Gap Regulator Output Voltage VBG TA = 25°C 1.990 2.010 V TC = -55°C, +125°C 1.980 2.020 V BG Regulator Voltage Max Change 1/ 2/ BG -75 75 mV Band Gap Load Regulation IBG = 0 to 2mA -5 5 mV Internal Output Pull-Up Resistor RINT 812 K Comparator Pulse Delay Low to High tDLH CL = 37pF , VEN = VENH, VREF = 1V, VIN = 2V, ISINK = 0, See Figure 2 3/ 0.2 10 µS Comparator Pulse Delay High to Low tDHL 80 150 nS Enable Delay to Vout tEDVLH CL = 37pF, VIN = 0V, VREF = 1V, ISINK = 0, See Figure 2 3/ 100 1500 nS tEDVHL 500 3000 nS Enable Delay to Iout tEDILH CL = 68pF, ISINK = 0, See Figure 2 3/ 100 250 nS tEDIHL 100 250 nS Supply current Disabled Enabled 1/ ICCD ICCE - - 4.0 7.0 mA mA Notes: 1/ The active element that makes up this device has been tested to 200 krad(Si) to assure RHA designator level ’R’ (100 krad(Si)) of Method 1019, condition A of MIL-STD-883 at +25°C for these parameters. The element will be re-tested after design or process changes that can affect RHA response of these elements. 2/ Guaranteed by design, but not tested. 3/ Test fixture node capacitance plus 10pF scope capacitance. VBG IBG |
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