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CD4538BC 数据表(PDF) 7 Page - National Semiconductor (TI) |
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CD4538BC 数据表(HTML) 7 Page - National Semiconductor (TI) |
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7 / 10 page ![]() Typical Applications (Continued) TLF6000 – 10 FIGURE 6 Switching Test Waveforms TLF6000 – 11 CL e 50 pF RX e RX e 100 kX CX e CX e 100 pF C1 e C2 e 01 mF TLF6000 – 12 Input Connections Characteristics CD A B tPLH tPHL tTLH tTHL VDD PG1 VDD PWOUT tWH tWL tPLH tPHL tTLH tTHL VDD VSS PG2 PWOUT tWH tWL tPLH(R) tPHL(R) PG3 PG1 PG2 tWH tWL Includes capacitance of probes wiring and fixture parasitic Note Switching test waveforms for PG1 PG2 PG3 are shown in Figure 6 TLF6000 – 13 FIGURE 7 Switching Test Circuit TLF6000 – 14 Duty Cycle e 50% FIGURE 8 Power Dissipation Test Circuit and Waveforms 7 |
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