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SP800LCN/TR 数据表(PDF) 13 Page - Sipex Corporation |
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SP800LCN/TR 数据表(HTML) 13 Page - Sipex Corporation |
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13 / 24 page ![]() Date: 5/25/04 SP691A/693A/800L/800M Low Power Microprocessor Supervisor with Battery Switch-Over © Copyright 2004 Sipex Corporation 13 RESET and RESET are asserted for the reset timeout period (200ms nominal). WDO goes to logic low and remains low until the next transition at WDI. Refer to Figure 20. If WDI is held high or low indefinitely, RESET and RESET will generate 200ms pulses every 1.6s. WDO has a 2 x TTL output characteristic. Selecting an Alternative Watchdog Timeout Period The OSC SEL and OSCIN inputs control the watchdog are reset timeout periods. Floating OSC SEL and OSCIN or tying them both to VOUT selects the nominal 1.6s watchdog timeout period and 200ms reset timout period. Connecting OSC IN to ground and floating or connecting OSC SEL to VOUT selects a 100ms nor- mal watchdog timeout period and a 1.6s timeout period immediately after reset. The reset timeout period remains 200ms. Refer to Figure 20. Select alternative timeout periods by connecting OSC SEL to ground and connecting a capacitor between OSC IN and ground, or by externally driving OSC IN . A synopsis of this control can be found in Figure 21 and Table 1. Chip-Enable Signal Gating The SP691A/693A/800L/800M devices provide internal gating of chip-enable (CE) signals, to prevent erroneous data from corrupting the CMOS RAM in the event of a power failure. During normal operation, the CE gate is enabled and passes all CE transitions. When reset is asserted, this path becomes disabled, preventing erroneous data from corrupting the CMOS RAM. The SP691A/ 693A/800L/800M devices use a series transmission gate from CE IN to CEOUT. Refer to Figure 16. The 10ns maximum CE propagation from CE IN to CE OUT enables the SP691A/693A/800L/ 800M devices to be used with most µPs. Chip-Enable Input CE IN is in high impedance (disabled mode) while RESET and/or RESET are asserted. During a power-down sequence where V CC falls below the reset threshold, CE IN assumes a high impedance state when the voltage at CE IN goes high or 12 µs after RESET is asserted, whichever occurs first. Refer to Figure 19. During a power-up sequence, CE IN remains high impedance until RESET is deasserted. In the high-impedance mode, the leakage currents into CE IN are <1µA over temperature. In the low-impedance mode, the impedance of CE IN appears as a 65Ω resistor in series with the load at CE OUT. The propagation delay through the CE transmission gate depends on both the source impedance of the drive to CE IN and the capacitive loading on CE OUT (see the Chip-Enable Propagation Delay vs. CE OUT Load Capacitance graph in the Typical Performance Characteristics section). The CE propagation delay is defined from the 50% point on CE IN to the 50% point on CEOUT using a 50 Ω driver and 50pF of load capacitance as in Figure 22. For minimum propagation delay, minimize the capacitive load at CE OUT and use a low output-impedance driver. C S O L E S C S O N I d o i r e P t u o e m i T g o d h c t a W d o i r e P t u o e m i T t e s e R l a m r o Nt e s e R r e t f A y l e t a i d e m m I W O Lt u p n I k c o l C l a n r e t x Es k c o l c 4 2 0 1s k c o l c 6 9 0 4s k c o l c 8 4 0 2 W O Lr o t i c a p a C l a n r e t x Es m ) C x F p 7 4 / 0 0 6 (c e s ) C x f p 7 . 4 / 4 . 2 (s m ) C x F p 7 4 / 0 0 2 1 ( g n i t a o l FW O Ls m 0 0 1s 6 . 1s m 0 0 2 g n i t a o l Fg n i t a o l Fs 6 . 1s 6 . 1s m 0 0 2 Table 1. Reset Pulse Width and Watchdog Timeout Selections |
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