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SP800MCT/TR 数据表(PDF) 13 Page - Sipex Corporation

部件名 SP800MCT/TR
功能描述  Low Power Microprocessor Supervisory with Battery Switch-Over
PDF  24 Pages
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制造商  SIPEX [Sipex Corporation]
网页  http://www.sipex.com
标志 SIPEX - Sipex Corporation

SP800MCT/TR 数据表(HTML) 13 Page - Sipex Corporation

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Date: 5/25/04
SP691A/693A/800L/800M Low Power Microprocessor Supervisor with Battery Switch-Over © Copyright 2004 Sipex Corporation
13
RESET and RESET are asserted for the reset
timeout period (200ms nominal). WDO goes
to logic low and remains low until the next
transition at WDI. Refer to Figure 20. If WDI
is held high or low indefinitely, RESET and
RESET will generate 200ms pulses every 1.6s.
WDO has a 2 x TTL output characteristic.
Selecting an Alternative Watchdog
Timeout Period
The OSC
SEL and OSCIN inputs control the
watchdog are reset timeout periods. Floating
OSC
SEL and OSCIN or tying them both to VOUT
selects the nominal 1.6s watchdog timeout
period and 200ms reset timout period.
Connecting OSC
IN to ground and floating or
connecting OSC
SEL to VOUT selects a 100ms nor-
mal watchdog timeout period and a 1.6s timeout
period immediately after reset. The reset timeout
period remains 200ms. Refer to Figure 20.
Select alternative timeout periods by connecting
OSC
SEL to ground and connecting a capacitor
between OSC
IN and ground, or by externally
driving OSC
IN . A synopsis of this control can
be found in Figure 21 and Table 1.
Chip-Enable Signal Gating
The SP691A/693A/800L/800M devices
provide internal gating of chip-enable (CE)
signals, to prevent erroneous data from
corrupting the CMOS RAM in the event of a
power failure. During normal operation, the CE
gate is enabled and passes all CE transitions.
When reset is asserted, this path becomes
disabled, preventing erroneous data from
corrupting the CMOS RAM. The SP691A/
693A/800L/800M devices use a series transmission
gate from CE
IN to CEOUT. Refer to Figure 16.
The 10ns maximum CE propagation from CE
IN
to CE
OUT enables the SP691A/693A/800L/
800M devices to be used with most
µPs.
Chip-Enable Input
CE
IN is in high impedance (disabled mode)
while RESET and/or RESET are asserted.
During a power-down sequence where V
CC falls
below the reset threshold, CE
IN assumes a high
impedance state when the voltage at CE
IN goes
high or 12
µs after RESET is asserted,
whichever occurs first. Refer to Figure 19.
During a power-up sequence, CE
IN remains high
impedance until RESET is deasserted.
In the high-impedance mode, the leakage
currents into CE
IN are <1µA over temperature.
In the low-impedance mode, the impedance of
CE
IN appears as a 65Ω resistor in series with
the load at CE
OUT.
The propagation delay through the CE
transmission gate depends on both the source
impedance of the drive to CE
IN and the
capacitive loading on CE
OUT
(see the
Chip-Enable Propagation Delay vs. CE
OUT
Load Capacitance graph in the Typical
Performance Characteristics section). The
CE propagation delay is defined from the 50%
point on CE
IN to the 50% point on CEOUT using
a 50
Ω driver and 50pF of load capacitance as in
Figure 22. For minimum propagation delay,
minimize the capacitive load at CE
OUT and use
a low output-impedance driver.
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Table 1. Reset Pulse Width and Watchdog Timeout Selections



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